Yang, H.; Chen, R.; Han, J.; Liang, Y.; Ma, Y.; Wu, H.
Preliminary Study on the Model of Thermal Laser Stimulation for Defect Localization in Integrated Circuits. Appl. Sci. 2020, 10, 8576.
https://doi.org/10.3390/app10238576
AMA Style
Yang H, Chen R, Han J, Liang Y, Ma Y, Wu H.
Preliminary Study on the Model of Thermal Laser Stimulation for Defect Localization in Integrated Circuits. Applied Sciences. 2020; 10(23):8576.
https://doi.org/10.3390/app10238576
Chicago/Turabian Style
Yang, Han, Rui Chen, Jianwei Han, Yanan Liang, Yingqi Ma, and Hao Wu.
2020. "Preliminary Study on the Model of Thermal Laser Stimulation for Defect Localization in Integrated Circuits" Applied Sciences 10, no. 23: 8576.
https://doi.org/10.3390/app10238576
APA Style
Yang, H., Chen, R., Han, J., Liang, Y., Ma, Y., & Wu, H.
(2020). Preliminary Study on the Model of Thermal Laser Stimulation for Defect Localization in Integrated Circuits. Applied Sciences, 10(23), 8576.
https://doi.org/10.3390/app10238576