Duong, B.P.; Kim, J.Y.; Jeong, I.; Im, K.; Kim, C.H.; Kim, J.M.
A Deep-Learning-Based Bearing Fault Diagnosis Using Defect Signature Wavelet Image Visualization. Appl. Sci. 2020, 10, 8800.
https://doi.org/10.3390/app10248800
AMA Style
Duong BP, Kim JY, Jeong I, Im K, Kim CH, Kim JM.
A Deep-Learning-Based Bearing Fault Diagnosis Using Defect Signature Wavelet Image Visualization. Applied Sciences. 2020; 10(24):8800.
https://doi.org/10.3390/app10248800
Chicago/Turabian Style
Duong, Bach Phi, Jae Young Kim, Inkyu Jeong, Kichang Im, Cheol Hong Kim, and Jong Myon Kim.
2020. "A Deep-Learning-Based Bearing Fault Diagnosis Using Defect Signature Wavelet Image Visualization" Applied Sciences 10, no. 24: 8800.
https://doi.org/10.3390/app10248800
APA Style
Duong, B. P., Kim, J. Y., Jeong, I., Im, K., Kim, C. H., & Kim, J. M.
(2020). A Deep-Learning-Based Bearing Fault Diagnosis Using Defect Signature Wavelet Image Visualization. Applied Sciences, 10(24), 8800.
https://doi.org/10.3390/app10248800