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Shanidze LV, Tarasov AS, Rautskiy MV, Zelenov FV, Konovalov SO, Nemtsev IV, Voloshin AS, Tarasov IA, Baron FA, Volkov NV. Cu-Doped TiN_xO_y Thin Film Resistors DC/RF Performance and Reliability. Applied Sciences. 2021; 11(16):7498. https://doi.org/10.3390/app11167498

Shanidze, Lev V., Anton S. Tarasov, Mikhail V. Rautskiy, Fyodor V. Zelenov, Stepan O. Konovalov, Ivan V. Nemtsev, Alexander S. Voloshin, Ivan A. Tarasov, Filipp A. Baron, and Nikita V. Volkov. 2021. "Cu-Doped TiN_xO_y Thin Film Resistors DC/RF Performance and Reliability" Applied Sciences 11, no. 16: 7498. https://doi.org/10.3390/app11167498

Shanidze, L. V., Tarasov, A. S., Rautskiy, M. V., Zelenov, F. V., Konovalov, S. O., Nemtsev, I. V., Voloshin, A. S., Tarasov, I. A., Baron, F. A., & Volkov, N. V. (2021). Cu-Doped TiN_xO_y Thin Film Resistors DC/RF Performance and Reliability. Applied Sciences, 11(16), 7498. https://doi.org/10.3390/app11167498