Ryu, M.; Ng, S.H.; Anand, V.; Lundgaard, S.; Hu, J.; Katkus, T.; Appadoo, D.; Vilagosh, Z.; Wood, A.W.; Juodkazis, S.;
et al. Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy. Appl. Sci. 2021, 11, 7632.
https://doi.org/10.3390/app11167632
AMA Style
Ryu M, Ng SH, Anand V, Lundgaard S, Hu J, Katkus T, Appadoo D, Vilagosh Z, Wood AW, Juodkazis S,
et al. Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy. Applied Sciences. 2021; 11(16):7632.
https://doi.org/10.3390/app11167632
Chicago/Turabian Style
Ryu, Meguya, Soon Hock Ng, Vijayakumar Anand, Stefan Lundgaard, Jingwen Hu, Tomas Katkus, Dominique Appadoo, Zoltan Vilagosh, Andrew W. Wood, Saulius Juodkazis,
and et al. 2021. "Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy" Applied Sciences 11, no. 16: 7632.
https://doi.org/10.3390/app11167632
APA Style
Ryu, M., Ng, S. H., Anand, V., Lundgaard, S., Hu, J., Katkus, T., Appadoo, D., Vilagosh, Z., Wood, A. W., Juodkazis, S., & Morikawa, J.
(2021). Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy. Applied Sciences, 11(16), 7632.
https://doi.org/10.3390/app11167632