Figure 1.
Cylindrical calibrator FEM model.
Figure 1.
Cylindrical calibrator FEM model.
Figure 2.
Rectangular calibrator FEM model.
Figure 2.
Rectangular calibrator FEM model.
Figure 3.
Cylindrical calibrator FRF [1000–3500] Hz—Amplitude.
Figure 3.
Cylindrical calibrator FRF [1000–3500] Hz—Amplitude.
Figure 4.
Cylindrical calibrator FRF amplitude ratio [1000–3500] Hz.
Figure 4.
Cylindrical calibrator FRF amplitude ratio [1000–3500] Hz.
Figure 5.
Cylindrical calibrator FRF [1000–3500] Hz—Phase.
Figure 5.
Cylindrical calibrator FRF [1000–3500] Hz—Phase.
Figure 6.
Cylindrical calibrators’ pressure ISO surface for microphone exposition evaluation—general view.
Figure 6.
Cylindrical calibrators’ pressure ISO surface for microphone exposition evaluation—general view.
Figure 7.
Cylindrical calibrators’ pressure ISO surface for microphone exposition evaluation—top view.
Figure 7.
Cylindrical calibrators’ pressure ISO surface for microphone exposition evaluation—top view.
Figure 8.
Rectangular calibrators’ pressure ISO surface for microphone exposition evaluation—general view.
Figure 8.
Rectangular calibrators’ pressure ISO surface for microphone exposition evaluation—general view.
Figure 9.
Rectangular calibrators’ pressure ISO surface for microphone exposition evaluation—top view.
Figure 9.
Rectangular calibrators’ pressure ISO surface for microphone exposition evaluation—top view.
Figure 10.
Conic speaker and geometrical characteristics.
Figure 10.
Conic speaker and geometrical characteristics.
Figure 11.
Speaker emission path and frequency response.
Figure 11.
Speaker emission path and frequency response.
Figure 12.
Class-1 0.5′ declared 50 mV/Pa microphones.
Figure 12.
Class-1 0.5′ declared 50 mV/Pa microphones.
Figure 13.
Microphones’ typical free-field frequency response function (FRF).
Figure 13.
Microphones’ typical free-field frequency response function (FRF).
Figure 14.
Calibrator. prototype—Configuration A.
Figure 14.
Calibrator. prototype—Configuration A.
Figure 15.
Calibrator prototype—Configuration B.
Figure 15.
Calibrator prototype—Configuration B.
Figure 16.
Calibrator cap prototype—Configuration A S-S.
Figure 16.
Calibrator cap prototype—Configuration A S-S.
Figure 17.
Calibrator cap prototype—Configuration A F-F.
Figure 17.
Calibrator cap prototype—Configuration A F-F.
Figure 18.
Calibrator cap prototype—Configuration B S-S.
Figure 18.
Calibrator cap prototype—Configuration B S-S.
Figure 19.
Detail of the positioning of the microphones into the calibrator’s cap.
Figure 19.
Detail of the positioning of the microphones into the calibrator’s cap.
Figure 20.
Test version of the software.
Figure 20.
Test version of the software.
Figure 21.
Configuration A S-S—phase difference before calibration.
Figure 21.
Configuration A S-S—phase difference before calibration.
Figure 22.
Configuration A S-S—amplitude and ratio.
Figure 22.
Configuration A S-S—amplitude and ratio.
Figure 23.
Configuration A S-S—coherence before calibration.
Figure 23.
Configuration A S-S—coherence before calibration.
Figure 24.
Configuration A S-S—coherence and phase difference for calibrated measurement.
Figure 24.
Configuration A S-S—coherence and phase difference for calibrated measurement.
Figure 25.
Configuration A S-S—phase difference for calibrated measurement.
Figure 25.
Configuration A S-S—phase difference for calibrated measurement.
Figure 26.
Configuration B S-S—coherence before calibration.
Figure 26.
Configuration B S-S—coherence before calibration.
Figure 27.
Configuration B S-S—phase difference before calibration.
Figure 27.
Configuration B S-S—phase difference before calibration.
Figure 28.
Configuration B S-S—amplitude and ratio.
Figure 28.
Configuration B S-S—amplitude and ratio.
Figure 29.
Configuration B S-S—coherence and phase difference for calibrated measurement.
Figure 29.
Configuration B S-S—coherence and phase difference for calibrated measurement.
Figure 30.
Configuration B S-S—phase difference for calibrated measurement.
Figure 30.
Configuration B S-S—phase difference for calibrated measurement.
Figure 31.
Configuration A F-F—coherence before calibration.
Figure 31.
Configuration A F-F—coherence before calibration.
Figure 32.
Configuration A F-F—phase difference before calibration.
Figure 32.
Configuration A F-F—phase difference before calibration.
Figure 33.
Configuration A F-F—amplitude and ratio.
Figure 33.
Configuration A F-F—amplitude and ratio.
Figure 34.
Configuration A F-F—coherence for calibrated measurement.
Figure 34.
Configuration A F-F—coherence for calibrated measurement.
Figure 35.
Configuration A F-F—phase difference for calibrated measurement.
Figure 35.
Configuration A F-F—phase difference for calibrated measurement.
Figure 36.
Configuration A F-F—phase difference for calibrated measurement.
Figure 36.
Configuration A F-F—phase difference for calibrated measurement.
Figure 37.
Configuration A F-F, scaled (left)—commercial state-of-the art acoustic coupler (right).
Figure 37.
Configuration A F-F, scaled (left)—commercial state-of-the art acoustic coupler (right).
Figure 38.
Configuration A F-F, scaled—phase difference for calibrated measurement.
Figure 38.
Configuration A F-F, scaled—phase difference for calibrated measurement.
Figure 39.
Configuration A F-F, scaled—phase difference for calibrated measurement.
Figure 39.
Configuration A F-F, scaled—phase difference for calibrated measurement.
Figure 40.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [60–7000] Hz frequency range.
Figure 40.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [60–7000] Hz frequency range.
Figure 41.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [60–1000] Hz frequency range.
Figure 41.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [60–1000] Hz frequency range.
Figure 42.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [1000–4000] Hz frequency range.
Figure 42.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [1000–4000] Hz frequency range.
Figure 43.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [4000–7000] Hz frequency range.
Figure 43.
Comparison between the phase difference for calibrated measurement for prototypes and reference instruments in the [4000–7000] Hz frequency range.
Table 1.
Prototype configuration and versions.
Table 1.
Prototype configuration and versions.
Configuration | Characteristics |
---|
Configuration A S-S | Side-to-side 16 mm spaced microphones |
Configuration A F-F | Face-to-face tightly spaced microphones |
Configuration B S-S | Side-to-side 16 mm spaced microphones |
Table 2.
Final sotware modules and capabilities.
Table 2.
Final sotware modules and capabilities.
Module | Scope |
---|
Calibration module | Phase correction calculation |
FFT module | Single signal analysis |
Measurement module | Measuring of corrected phase mismatch |
Table 3.
Configuration A S-S—test specification and results before calibration.
Table 3.
Configuration A S-S—test specification and results before calibration.
Test Specification | Results |
---|
H2 estimator | Probable distinct modeshapes at 2200 and 5800 Hz |
30 averages | Coherence drop at extsimeq 2200 and 5800 Hz |
Hanning windowing | Phase differences up to 100 deg |
Table 4.
Configuration A S-S—test specification and results for calibrated measurement.
Table 4.
Configuration A S-S—test specification and results for calibrated measurement.
Test Specification | Results |
---|
H1 estimator | Probable modeshapes at extsimeq 5800 Hz |
30 averages | Coherence drop at extsimeq 5800 Hz |
Hanning windowing | Phase differences up to 1 deg at extsimeq 2200 Hz |
/ | Phase differences up to 10 deg at extsimeq 5800 Hz |
/ | Phase difference bounded [−0.5 0.5] deg in [60–5000] Hz frequency range |
Table 5.
Configuration B S-S—test specification and results before calibration.
Table 5.
Configuration B S-S—test specification and results before calibration.
Test Specification | Results |
---|
H2 estimator | Great variability in [1500–2000] Hz and [5000–6500] Hz frequency ranges |
30 averages | Phase differences up to 80 deg |
Hanning windowing | / |
Table 6.
Configuration B S-S—test specification and results for calibrated measurement.
Table 6.
Configuration B S-S—test specification and results for calibrated measurement.
Test Specification | Results |
---|
H1 estimator | Phase differences up to −2 deg in [1500–2000] Hz frequency range |
30 averages | Phase differences up to 3 deg in [5000–6500] Hz frequency ranges |
Hanning windowing | Phase difference bounded [−0.6 0.6] deg in 60–7000 Hz frequency range |
Table 7.
Configuration A F-F—test specification and results before calibration.
Table 7.
Configuration A F-F—test specification and results before calibration.
Test Specification | Results |
---|
H1 estimator | Phase mismatch peak at 4800 Hz |
50 averages | No Coherence drop at 4800 Hz |
Hanning windowing | Phase differences up to 10 deg |
Table 8.
Configuration A F-F—test specification and results for calibrated measurement.
Table 8.
Configuration A F-F—test specification and results for calibrated measurement.
Test Specification | Results |
---|
H1 estimator | Phase differences up to 0.6 deg in [60–7000] Hz frequency ranges |
50 averages | Phase difference bounded [−0.2 0.2] deg in [60–6800] Hz frequency range |
Hanning windowing | / |
Table 9.
Configuration A S-S, scaled—test specification and results for calibrated measurement.
Table 9.
Configuration A S-S, scaled—test specification and results for calibrated measurement.
Test Specification | Results |
---|
H1 estimator | Good stability up to 4000 Hz |
50 averages | Increasing phase mismatch for f > 4000 Hz |
Hanning windowing | Phase differences lesser than 0.06 deg in [60–4000] Hz frequency range |