Duan, Y.; Xue, K.; Sun, H.; Bao, H.; Wei, Y.; You, Z.; Zhang, Y.; Jiang, X.; Yang, S.; Chen, J.;
et al. LogEDL: Log Anomaly Detection via Evidential Deep Learning. Appl. Sci. 2024, 14, 7055.
https://doi.org/10.3390/app14167055
AMA Style
Duan Y, Xue K, Sun H, Bao H, Wei Y, You Z, Zhang Y, Jiang X, Yang S, Chen J,
et al. LogEDL: Log Anomaly Detection via Evidential Deep Learning. Applied Sciences. 2024; 14(16):7055.
https://doi.org/10.3390/app14167055
Chicago/Turabian Style
Duan, Yunfeng, Kaiwen Xue, Hao Sun, Haotong Bao, Yadong Wei, Zhangzheng You, Yuantian Zhang, Xiwei Jiang, Sangning Yang, Jiaxing Chen,
and et al. 2024. "LogEDL: Log Anomaly Detection via Evidential Deep Learning" Applied Sciences 14, no. 16: 7055.
https://doi.org/10.3390/app14167055
APA Style
Duan, Y., Xue, K., Sun, H., Bao, H., Wei, Y., You, Z., Zhang, Y., Jiang, X., Yang, S., Chen, J., Duan, B., & Ou, Z.
(2024). LogEDL: Log Anomaly Detection via Evidential Deep Learning. Applied Sciences, 14(16), 7055.
https://doi.org/10.3390/app14167055