Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm
Abstract
:1. Introduction
2 Method
2.1. General Regression Neural Network
2.2. LR Model
3. Application
3.1. Experiment Setup and a Call-for-Maintenance Case
3.2. Data Mining with Feature Extraction
3.3. Labeling the Initial CVs from 1 to 0 as Linearly-Spaced Values for GRNN
3.4. Result Discussion
4. Conclusions
- This method provides a GA–GRNN that mimics the relaying of original feature data to determine the CV for a call-for-maintenance RUL model. Using the GA–GRNN, the CV can be determined and adjusted when performance degradation occurs. GA–GRNN can calculate the CV score and determine an ultimate degradation trend when a different machine is running.
- Using LR as a predictive machine health model denotes 1 in advance and 0 only after run-to-failure maintenance; this is time consuming and incurs a high cost, and is not feasible for predicting health statuses in major practical industrial problems. This study successfully demonstrated feature extraction with a GA–GRNN, with the ability to update the trend from the initial healthy CV to the final failure CV with data from each day.
- This study provides a methodology based on data-mining methods, including data preprocessing, feature extraction, feature selection, normalization, artificial intelligence algorithms with GA, and evaluation with feature-based GRNN. The GA-GNNN successfully determined the CV of real machinery to predict degradation. Our future study will focus on using a long short-term memory network for more efficient training of the labels of machine statuses.
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Huang, Y.-C.; Yang, Z.-S.; Liao, H.-S. Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm. Appl. Sci. 2019, 9, 4241. https://doi.org/10.3390/app9204241
Huang Y-C, Yang Z-S, Liao H-S. Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm. Applied Sciences. 2019; 9(20):4241. https://doi.org/10.3390/app9204241
Chicago/Turabian StyleHuang, Yi-Cheng, Zi-Sheng Yang, and Hsien-Shu Liao. 2019. "Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm" Applied Sciences 9, no. 20: 4241. https://doi.org/10.3390/app9204241
APA StyleHuang, Y. -C., Yang, Z. -S., & Liao, H. -S. (2019). Labeling Confidence Values for Wafer-Handling Robot Arm Performance Using a Feature-Based General Regression Neural Network and Genetic Algorithm. Applied Sciences, 9(20), 4241. https://doi.org/10.3390/app9204241