Stenzel, O.; Wilbrandt, S.; Stempfhuber, S.; Gäbler, D.; Wolleb, S.-J.
Spectrophotometric Characterization of Thin Copper and Gold Films Prepared by Electron Beam Evaporation: Thickness Dependence of the Drude Damping Parameter. Coatings 2019, 9, 181.
https://doi.org/10.3390/coatings9030181
AMA Style
Stenzel O, Wilbrandt S, Stempfhuber S, Gäbler D, Wolleb S-J.
Spectrophotometric Characterization of Thin Copper and Gold Films Prepared by Electron Beam Evaporation: Thickness Dependence of the Drude Damping Parameter. Coatings. 2019; 9(3):181.
https://doi.org/10.3390/coatings9030181
Chicago/Turabian Style
Stenzel, Olaf, Steffen Wilbrandt, Sven Stempfhuber, Dieter Gäbler, and Sabrina-Jasmin Wolleb.
2019. "Spectrophotometric Characterization of Thin Copper and Gold Films Prepared by Electron Beam Evaporation: Thickness Dependence of the Drude Damping Parameter" Coatings 9, no. 3: 181.
https://doi.org/10.3390/coatings9030181
APA Style
Stenzel, O., Wilbrandt, S., Stempfhuber, S., Gäbler, D., & Wolleb, S. -J.
(2019). Spectrophotometric Characterization of Thin Copper and Gold Films Prepared by Electron Beam Evaporation: Thickness Dependence of the Drude Damping Parameter. Coatings, 9(3), 181.
https://doi.org/10.3390/coatings9030181