Article Versions Notes

Vohánka J, Ohlídal I, Ohlídal M, Šustek Š, Čermák M, Šulc V, Vašina P, Ženíšek J, Franta D. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. 2019; 9(7):416. https://doi.org/10.3390/coatings9070416

Vohánka, Jiří, Ivan Ohlídal, Miloslav Ohlídal, Štěpán Šustek, Martin Čermák, Václav Šulc, Petr Vašina, Jaroslav Ženíšek, and Daniel Franta. 2019. "Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects" Coatings 9, no. 7: 416. https://doi.org/10.3390/coatings9070416

Vohánka, J., Ohlídal, I., Ohlídal, M., Šustek, Š., Čermák, M., Šulc, V., Vašina, P., Ženíšek, J., & Franta, D. (2019). Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings, 9(7), 416. https://doi.org/10.3390/coatings9070416