Chu, X.; Xun, T.; Wang, L.; Liu, J.; Yang, H.; He, J.; Zhang, J.
Breakdown Behavior of GaAs PCSS with a Backside-Light-Triggered Coplanar Electrode Structure. Electronics 2021, 10, 357.
https://doi.org/10.3390/electronics10030357
AMA Style
Chu X, Xun T, Wang L, Liu J, Yang H, He J, Zhang J.
Breakdown Behavior of GaAs PCSS with a Backside-Light-Triggered Coplanar Electrode Structure. Electronics. 2021; 10(3):357.
https://doi.org/10.3390/electronics10030357
Chicago/Turabian Style
Chu, Xu, Tao Xun, Langning Wang, Jinliang Liu, Hanwu Yang, Juntao He, and Jun Zhang.
2021. "Breakdown Behavior of GaAs PCSS with a Backside-Light-Triggered Coplanar Electrode Structure" Electronics 10, no. 3: 357.
https://doi.org/10.3390/electronics10030357
APA Style
Chu, X., Xun, T., Wang, L., Liu, J., Yang, H., He, J., & Zhang, J.
(2021). Breakdown Behavior of GaAs PCSS with a Backside-Light-Triggered Coplanar Electrode Structure. Electronics, 10(3), 357.
https://doi.org/10.3390/electronics10030357