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Journal: Electronics, 2022
Volume: 11
Number: 1985
Article:
Adaptation of the Four Levels of Test Maturity Model Integration with Agile and Risk-Based Test Techniques
Authors:
by
Ahmet Unudulmaz, Mustafa Özgür Cingiz and Oya Kalıpsız
Link:
https://www.mdpi.com/2079-9292/11/13/1985
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