Niewolski, W.; Nowak, T.W.; Sepczuk, M.; Kotulski, Z.; Artych, R.; Bocianiak, K.; Wary, J.-P.
Security Context Migration in MEC: Challenges and Use Cases. Electronics 2022, 11, 3512.
https://doi.org/10.3390/electronics11213512
AMA Style
Niewolski W, Nowak TW, Sepczuk M, Kotulski Z, Artych R, Bocianiak K, Wary J-P.
Security Context Migration in MEC: Challenges and Use Cases. Electronics. 2022; 11(21):3512.
https://doi.org/10.3390/electronics11213512
Chicago/Turabian Style
Niewolski, Wojciech, Tomasz W. Nowak, Mariusz Sepczuk, Zbigniew Kotulski, Rafal Artych, Krzysztof Bocianiak, and Jean-Philippe Wary.
2022. "Security Context Migration in MEC: Challenges and Use Cases" Electronics 11, no. 21: 3512.
https://doi.org/10.3390/electronics11213512
APA Style
Niewolski, W., Nowak, T. W., Sepczuk, M., Kotulski, Z., Artych, R., Bocianiak, K., & Wary, J. -P.
(2022). Security Context Migration in MEC: Challenges and Use Cases. Electronics, 11(21), 3512.
https://doi.org/10.3390/electronics11213512