A Review on SIW and Its Applications to Microwave Components
Abstract
:1. Introduction
2. Modes in SIW
3. SIW Design Basics
4. Transitions in SIW
5. Losses in Substrate-Integrated Waveguides
6. Performance Attributes of the SIW
- A stress assessment should be performed to obtain the physical change in dimensions in connection with environment temperature as the input;
- A full-wave field assessment should be conducted to verify the frequency shift versus the changes in the physical dimension and selected substrate permittivity;
- A redesign of the given device/component by compensating for the adjustments in the electrical parameters.
- A full-wave field assessment should be conducted to establish the power dissipation and its allocation;
- The dispersed power should be employed in the performance of a thermal assessment and the temperature increase and local hot spots established;
- A comparison of the worst-case values to the glass transition temperature of the substrate at which the material adjusts its performance from being glassy to being rubbery;
- The determination and application of the safety limits;
- A stress assessment should be performed to achieve the physical dimensional adjustment for the temperature allocation under extreme mean power;
- A full-wave field assessment should be conducted to establish the frequency shift along with the shift in bandwidth and return loss, using the revised dimension and substrate permittivity,
- A redesign of the given device/component by compensating for the adjustments in the electrical parameters.
7. Substrate Selection for SIW Implementation
- The physical size of an SIW device is directly linked to the permittivity or dielectric constant of the material used for the device implementation. The higher the material dielectric constant, the smaller the physical size of the SIW device.
- The amount of insertion loss observed in an SIW device relates to three factors: substrate thickness, dielectric loss, and copper foil.
- Thermal expansion and thermal coefficient of permittivity of a substrate material determines the temperature stability of an SIW device.
- SIW components are well known for their good power handling capabilities. The average power handling capability is based on the substrate thermal expansion, the thermal coefficient of permittivity, the thermal conductivity, and the glass transition temperature, while the peak power handling capability is only linked to the substrate dielectric strength.
8. Evolutionary Structures of the SIW
9. SIW Filter
10. SIW Multiplexer
11. SIW Power Divider/Combiner
12. SIW Antennas
13. SIW Sensors
14. Future Challenges of SIW
15. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Ref. | f0 (GHz) | Filter Order | No. of Bands | Insertion Loss (dB) | Return Loss (dB) | Dimension (λo × λo) |
---|---|---|---|---|---|---|
[67] | 1.7 | 3 | 1 | 1.3 | 22 | 0.27 × 0.63 |
[69] | 25/27 | 4 | 2 | 1.7/1.6 | 14 | - |
[70] | 7.5 | 5 | 1 | 1.5 | 19 | - |
[71] | 8/11.4 | 3 | 2 | 2.3/3.1 | 16 | 1.66 × 1.31 |
[72] | 11/12/13 | 5 | 3 | 3.7/3.8/2.5 | 14.4 | 3.88 × 2.17 |
Ref. | f1/f2 (GHz) | Filtering Order | Isolation (dB) | Insertion Loss (dB) | Return Loss (dB) | Dimension (λo × λo) |
---|---|---|---|---|---|---|
[17] | 1.7/1.9 | 5 | >50 | 2.86/2.91 | 15/12 | - |
[74] | 5/5.25 | 2 | >45 | 2.2/2.4 | 17/15 | 1.02 × 2.08 |
[74] | 5/5.25 | 2 | >40 | 1.8/1.5 | 16/18 | 1.02 × 2.08 |
[76] | 9.5/10.5 | 3 | >35 | 1.6/2.1 | 17/16 | 2.04 × 0.65 |
[77] | 10.5/13.5 | 3 | >42 | 0.9/1.4 | 14.4 | 2.14 ×1.30 |
Ref. | f0 (GHz) | Filtering Property | No. of Bands | Insolation (dB) | Return Loss (dB) | Dimension (λo × λo) |
---|---|---|---|---|---|---|
[79] | 3.5/4.7/6.3 | No | 3 | >14 | >20 | 0.03 × 1.0 |
[79] | 3.3/4.8/6.2/7.7 | No | 4 | >12 | >19 | 0.02 × 1.0 |
[80] | 5.9/6.4 | Yes | 2 | >21 | >20 | 0.77 × 1.0 |
[81] | 1.7/2.85 | Yes | 2 | >13 | >15 | 0.28 × 0.28 |
[82] | 11.8 | Yes | 3 | >16.8 | >18 | 1.47 × 0.87 |
Ref. | f0 (GHz) | Filtering Property | No. of Poles | No. of Bands | Fractional Bandwidth (%) | Gain (dBi) | Polarisation in Both E- and H-Planes (dB) | Dimension (λo × λo) |
---|---|---|---|---|---|---|---|---|
[84] | 9.6 | Yes | 2 | 1 | 2.53 | 5.8 | >20 | - |
[85] | 5.365 | Yes | 4 | 1 | 7.64 | 5.3 | >20 | 0.9 × 1.1 |
[86] | 11.8 | Yes | 3 | 1 | 11.84 | 5.0 | - | 0.48 × 0.47 |
[87] | 3.59/4.11 | Yes | 4 | 2 | 2.3 | 4.84 | >16 | 1.3 × 1.1 |
[92] | 27.5 | Yes | 3 | 1 | 25.8 | 8.9 | >29 | 3.94 × 3.26 |
[93] | 25.5 | Yes | 2 | 1 | 15.6 | 10.05 | - | 2.17 × 0.8 |
[94] | 7.25 | No | - | - | 1.52 | 3.16 | >12.5 | 0.265 × 0.318 |
Ref. | Operating Frequency (GHz) | Dimension (λo × λo) | Application | Quality Factor Achieved |
---|---|---|---|---|
[97] | 0.191 × 0.205 | Crack detection in metallic materials | >148 | |
[98] | - | Permittivity estimation of dielectric substrate materials | >515 | |
[99] | - | Complex permittivity measurement | >517 | |
[100] | - | Testing of dielectrics and composites | >32 | |
[101] | - | Characterisation of dielectric samples | very low | |
[102] | 0.25 × 0.42 | Liquid sensing | - |
Planar Components | Waveguide Components | SIW Components |
---|---|---|
Very good for low frequency applications but ineffective for millimetre-wave systems | Ideal for high frequency applications and systems | Works for both low and high frequency applications |
Require rigorous production concessions when implemented at high frequencies | Difficult to manufacture | Moderately easy to manufacture both at low and high frequencies |
Cost effective | Very expensive | Moderately cost effective |
Easy to integrate with other planar devices | Difficult to integrate with planar devices | Easy to integrate with planar devices |
Very compact but suffers from high radiation loss | Very bulky though with minimal radiation loss | Compact and enormously reduced radiation loss |
Low-level of unloaded quality factor | High-level of unloaded quality factor | Very good level of unloaded quality factor |
Low-level of power processing capability | High-level of power processing capability | Very good level of power processing capability |
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Nwajana, A.O.; Obi, E.R. A Review on SIW and Its Applications to Microwave Components. Electronics 2022, 11, 1160. https://doi.org/10.3390/electronics11071160
Nwajana AO, Obi ER. A Review on SIW and Its Applications to Microwave Components. Electronics. 2022; 11(7):1160. https://doi.org/10.3390/electronics11071160
Chicago/Turabian StyleNwajana, Augustine O., and Emenike Raymond Obi. 2022. "A Review on SIW and Its Applications to Microwave Components" Electronics 11, no. 7: 1160. https://doi.org/10.3390/electronics11071160
APA StyleNwajana, A. O., & Obi, E. R. (2022). A Review on SIW and Its Applications to Microwave Components. Electronics, 11(7), 1160. https://doi.org/10.3390/electronics11071160