Wrobel, F.; Aguiar, Y.; Marques, C.; Lerner, G.; García Alía, R.; Saigné, F.; Boch, J.
An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons. Electronics 2023, 12, 104.
https://doi.org/10.3390/electronics12010104
AMA Style
Wrobel F, Aguiar Y, Marques C, Lerner G, García Alía R, Saigné F, Boch J.
An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons. Electronics. 2023; 12(1):104.
https://doi.org/10.3390/electronics12010104
Chicago/Turabian Style
Wrobel, Frédéric, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, and Jérôme Boch.
2023. "An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons" Electronics 12, no. 1: 104.
https://doi.org/10.3390/electronics12010104
APA Style
Wrobel, F., Aguiar, Y., Marques, C., Lerner, G., García Alía, R., Saigné, F., & Boch, J.
(2023). An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons. Electronics, 12(1), 104.
https://doi.org/10.3390/electronics12010104