Article Versions Notes

d’Alessandro V, Catalano AP, Scognamillo C, Müller M, Schröter M, Zampardi PJ, Codecasa L. A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part I: Thermometer-Based Approaches. Electronics. 2023; 12(16):3471. https://doi.org/10.3390/electronics12163471

d’Alessandro, Vincenzo, Antonio Pio Catalano, Ciro Scognamillo, Markus Müller, Michael Schröter, Peter J. Zampardi, and Lorenzo Codecasa. 2023. "A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part I: Thermometer-Based Approaches" Electronics 12, no. 16: 3471. https://doi.org/10.3390/electronics12163471

d’Alessandro, V., Catalano, A. P., Scognamillo, C., Müller, M., Schröter, M., Zampardi, P. J., & Codecasa, L. (2023). A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part I: Thermometer-Based Approaches. Electronics, 12(16), 3471. https://doi.org/10.3390/electronics12163471