Fault Mechanism and Improvement in the Augmented Railgun Excitation Circuit
Abstract
:1. Introduction
2. Study of the Fault Mechanism of the PFN with Inductive Load
2.1. Analysis of the PFN Discharge Process
2.2. Experiment Platform and Data Measuring Methods
2.3. Acquisition and Analysis of the Experimental Data
3. Improvement in the Excitation Circuit
3.1. Solution of the Fly-Wheel Diode Damage
3.2. Verification Test of the Improved Excitation Circuit
3.3. Solution of the Residual Capacitive Energy
3.4. Launch Experiment of the Augmented Railgun Conducted on the Improved Circuit
4. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
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Symbol | Meaning | Quantity |
---|---|---|
Rload | Load resistance | 17 mΩ |
Lload | Load inductance | 530 uH |
Ri | Resistance of the current wave modulator | 2 mΩ |
Li | Inductance of the current wave modulator | 20 uH |
Ci | Capacitance | 2 mF |
Rsi | Fly-wheel resistance | 2 mΩ |
u0 | Initial charging voltage of PFU | 2000 V |
Symbol | Charging Voltage | Trigger Sequence in Tight Trigger Experiment | Trigger Sequence in Loose Trigger Experiment |
---|---|---|---|
PFU1 | 2000 V | 0 ms | 0 ms |
PFU2 | 2000 V | 0 ms | 0 ms |
PFU3 | 2000 V | 1 ms | 3 ms |
PFU4 | 2000 V | 1 ms | 3 ms |
PFU5 | 2000 V | 1.8 ms | 5 ms |
PFU6 | 2000 V | 1.8 ms | 5 ms |
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Cao, G.; Xiang, H.; Qiao, Z.; Liang, C.; Yuan, X. Fault Mechanism and Improvement in the Augmented Railgun Excitation Circuit. Electronics 2023, 12, 4607. https://doi.org/10.3390/electronics12224607
Cao G, Xiang H, Qiao Z, Liang C, Yuan X. Fault Mechanism and Improvement in the Augmented Railgun Excitation Circuit. Electronics. 2023; 12(22):4607. https://doi.org/10.3390/electronics12224607
Chicago/Turabian StyleCao, Genrong, Hongjun Xiang, Zhiming Qiao, Chunyan Liang, and Xichao Yuan. 2023. "Fault Mechanism and Improvement in the Augmented Railgun Excitation Circuit" Electronics 12, no. 22: 4607. https://doi.org/10.3390/electronics12224607
APA StyleCao, G., Xiang, H., Qiao, Z., Liang, C., & Yuan, X. (2023). Fault Mechanism and Improvement in the Augmented Railgun Excitation Circuit. Electronics, 12(22), 4607. https://doi.org/10.3390/electronics12224607