Doublet, M.; Defrance, N.; Okada, E.; Pace, L.; Duquesne, T.; Emilien, B.; Yvon, A.; Idir, N.; De Jaeger, J.-C.
Investigation of Current Collapse Mechanism on AlGaN/GaN Power Diodes. Electronics 2023, 12, 2007.
https://doi.org/10.3390/electronics12092007
AMA Style
Doublet M, Defrance N, Okada E, Pace L, Duquesne T, Emilien B, Yvon A, Idir N, De Jaeger J-C.
Investigation of Current Collapse Mechanism on AlGaN/GaN Power Diodes. Electronics. 2023; 12(9):2007.
https://doi.org/10.3390/electronics12092007
Chicago/Turabian Style
Doublet, Martin, Nicolas Defrance, Etienne Okada, Loris Pace, Thierry Duquesne, Bouyssou Emilien, Arnaud Yvon, Nadir Idir, and Jean-Claude De Jaeger.
2023. "Investigation of Current Collapse Mechanism on AlGaN/GaN Power Diodes" Electronics 12, no. 9: 2007.
https://doi.org/10.3390/electronics12092007
APA Style
Doublet, M., Defrance, N., Okada, E., Pace, L., Duquesne, T., Emilien, B., Yvon, A., Idir, N., & De Jaeger, J. -C.
(2023). Investigation of Current Collapse Mechanism on AlGaN/GaN Power Diodes. Electronics, 12(9), 2007.
https://doi.org/10.3390/electronics12092007
