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Journal: Electronics, 2024
Volume: 13
Number: 18

Article: CMBMeTest: Generation of Test Suites Using Model-Based Testing Plus Constraint Programming and Metamorphic Testing
Authors: by M. Carmen de Castro-Cabrera, Antonio García-Dominguez and Inmaculada Medina-Bulo
Link: https://www.mdpi.com/2079-9292/13/1/18

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