Liu, C.; Guo, G.; Shi, H.; Zhang, Z.; Li, F.; Zhang, Y.; Han, J.
Study on the Single-Event Burnout Effect Mechanism of SiC MOSFETs Induced by Heavy Ions. Electronics 2024, 13, 3402.
https://doi.org/10.3390/electronics13173402
AMA Style
Liu C, Guo G, Shi H, Zhang Z, Li F, Zhang Y, Han J.
Study on the Single-Event Burnout Effect Mechanism of SiC MOSFETs Induced by Heavy Ions. Electronics. 2024; 13(17):3402.
https://doi.org/10.3390/electronics13173402
Chicago/Turabian Style
Liu, Cuicui, Gang Guo, Huilin Shi, Zheng Zhang, Futang Li, Yanwen Zhang, and Jinhua Han.
2024. "Study on the Single-Event Burnout Effect Mechanism of SiC MOSFETs Induced by Heavy Ions" Electronics 13, no. 17: 3402.
https://doi.org/10.3390/electronics13173402
APA Style
Liu, C., Guo, G., Shi, H., Zhang, Z., Li, F., Zhang, Y., & Han, J.
(2024). Study on the Single-Event Burnout Effect Mechanism of SiC MOSFETs Induced by Heavy Ions. Electronics, 13(17), 3402.
https://doi.org/10.3390/electronics13173402