Layer-Edge Patterns Exploration and Presentation in Multiplex Networks: From Detail to Overview via Selections and Aggregations
Abstract
:1. Introduction
- An interactive exploration and analysis model that tightly couples topological structure and high-level patterns;
- a multi-force directed method specially for multiplex networks visualization, which realizes the balanced layout of nodes in multi-layer topology by considering the attraction from the center of the community and the cross-layer attraction from the counterpart node, and then the similar communities between layers can be identified quickly;
- two kinds of high-level patterns, of which the visual representations are, respectively, designed by a metaphor familiar to users—that is, the similar pattern representation based on the area-proportional Venn diagrams and the interaction pattern representation based on the directed arrow, which are convenient for non-expert users to obtain the abstract of interested regions;
- views association, enabling users to gain insights through the creation of selection of interest (layer, sub-graph, region, etc.), and produce high-level infographic-style views simultaneously.
2. Related Work
3. Theory and Methods
3.1. Model of Multiplex Networks
3.2. Tasks for Multiplex Networks Visual Analysis
3.3. Analysis Model from Detial to Overview
- Multi-style interaction methods—the user can directly operate the visual element and select the layer (or group) of interest;
- the ability to view detailed information and aggregated high-level patterns simultaneously with a familiar metaphor.
3.4. Topological Structure View
3.4.1. Community Detection
3.4.2. Multi-Force Directed Model
3.4.3. Iterative Algorithm Based on Simulated Annealing
3.5. High-Level Infographic-Style View
3.5.1. Similarity Pattern Representation
- Step1:
- Count the coordinates of the intersection of N rings and sort them clockwise to determine the centroid coordinates of the overlapping polygons .
- Step2:
- Calculate the size of the convex N-gon, , i.e., the sum of the sizes of N triangles by the formula (12) according to the centroid coordinates and the coordinates of two adjacent intersection points.
- Step3:
- Calculate the size of each arc region with the formula (13) by selecting the angles between two adjacent intersection points. Then the sum of the sizes of the N arc regions can be calculated.
- Step4:
- Calculate the sizes of N ring overlap areas by Formula (11).
3.5.2. Interaction Pattern Representation
- Each box container represents a selected area which is coded in the same color as the selection rectangular. Inside of the container, as shown in Figure 3b, is the node degree distribution of each area. The user can click on the box container to zoom in and display the internal information of the container. The histogram of the degree distribution of the internal nodes in each area is shown in Figure 3c. The containers can also display information such as node overlap degree, node activation degree, and node importance ranking in other forms of bubble chart, histogram, or ring chart.
- All the intra-edges of the area are displayed as a self-circulating directed arrow; all the inter-edges are shown as a directed arrow between the box containers and coded with a gradient of the colors of the starting area and the target area. The width of the arrow is proportional to the sum of the number of edges associated with the selected area.
3.6. Interaction and Views Association
3.6.1. Sharing of Underlying Data
3.6.2. Filtering by Node Attribute
4. Case Study
4.1. Multiplex Networks Data
4.2. TopolView Analysis
- Displaying the details of the nodes and edges in the network layer through the node-link diagrams, revealing the community composition in every network layer.
- Assisting users in perceiving the difference of the inter-layer structure on the intuitive, evaluating and predicting the distribution of the nodes and the edges in network, which facilitate users to find the layer (or sub-graph, region, etc.) and nodes of interest to further explore their interests.
- Supporting selection between multiple layout algorithms, which can be used to carry out deeper research on node automatic layout algorithm for multiplex network.
4.3. Similarity Pattern Analysis
4.4. Interaction Pattern Analysis
5. Discussions and Limitations
5.1. Discussions
5.2. Limitations and Future Directions
- This paper mainly provides an automatic layout method specially for multiplex networks visualization. However, the computational complexity of repulsion calculation is still large, and it is time-consuming to lay out large-scale nodes. The novel layout methods should take quadtrees, multidimensional scaling analysis, and many other methods into consideration to speed up node position calculation. Some other kinds of community detection algorithms can also be applied to effectively support the comparison analysis of the multi-layer structure.
- In terms of similarity pattern representation, the area-proportional circular Venn diagrams do better in visual perception. However, when the number of input sets is larger than six, the layout and size calculations will not be accurate. It is not suitable for the representation of the relationship between a larger number of sets. Since the specific analysis focuses more on the two- or three-layer comparison, the method in this paper basically meets the requirements.
- This article provides the necessary selection and filtering methods to basically satisfy users’ freedom to select the node elements of the specified area. However, the region selection requires community partitioning and force-directed layout in advance to cluster nodes that belong to a same community. Considering the scalability of the system, there is still a need for multiple styles of interaction to support freewill exploration.
6. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Task 1: Single-Layer Analysis |
Task 1.1: Structure component in terms of group of a given layer (Layer-Group Level) |
Task 1.1.1: Number and distribution of nodes in groups of a given layer (Group-Node Level) |
Task 1.1.2: Number and distribution of edges in groups of a given layer (Group -Edge Level) |
Task 1.2: Number of nodes of a given layer (Layer-Node Level) |
Task 1.3: Number of edges of a given layer (Layer-Edge Level) |
Task 2: Multi-Layer Analysis |
Task 2.1: Comparison between two or more given layers (Layer Level) |
Task 2.1.1: Comparison in terms of group between two or more given layers (Layer-Group Level) |
Task 2.1.2: Comparison in terms of the number and distribution of overlap nodes between two or more given layer (Layer-Node Level) |
Task 2.1.3: Comparison in terms of the number and distribution of overlap edges between two or more given layer (Layer-Edge Level) |
Task 2.2: Comparison in given groups between two or more given layers (Group Level) |
Task 2.2.1: Comparison in terms of number and distribution of overlap nodes in given groups between two or more given layers (Group-Node Level) |
Task 2.2.2: Comparison in terms of number and distribution of overlap edges in given groups between two or more given layers (Group-Edge Level) |
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Zhang, X.; Wu, L.; Yu, S.; Li, K. Layer-Edge Patterns Exploration and Presentation in Multiplex Networks: From Detail to Overview via Selections and Aggregations. Electronics 2019, 8, 387. https://doi.org/10.3390/electronics8040387
Zhang X, Wu L, Yu S, Li K. Layer-Edge Patterns Exploration and Presentation in Multiplex Networks: From Detail to Overview via Selections and Aggregations. Electronics. 2019; 8(4):387. https://doi.org/10.3390/electronics8040387
Chicago/Turabian StyleZhang, Xitao, Lingda Wu, Shaobo Yu, and Kang Li. 2019. "Layer-Edge Patterns Exploration and Presentation in Multiplex Networks: From Detail to Overview via Selections and Aggregations" Electronics 8, no. 4: 387. https://doi.org/10.3390/electronics8040387
APA StyleZhang, X., Wu, L., Yu, S., & Li, K. (2019). Layer-Edge Patterns Exploration and Presentation in Multiplex Networks: From Detail to Overview via Selections and Aggregations. Electronics, 8(4), 387. https://doi.org/10.3390/electronics8040387