Og, J.Y.; Pawelec, K.; Kim, B.-K.; Paprocki, R.; Jeong, E.
Measuring Patent Value Indicators with Patent Renewal Information. J. Open Innov. Technol. Mark. Complex. 2020, 6, 16.
https://doi.org/10.3390/joitmc6010016
AMA Style
Og JY, Pawelec K, Kim B-K, Paprocki R, Jeong E.
Measuring Patent Value Indicators with Patent Renewal Information. Journal of Open Innovation: Technology, Market, and Complexity. 2020; 6(1):16.
https://doi.org/10.3390/joitmc6010016
Chicago/Turabian Style
Og, Joo Young, Krzysztof Pawelec, Byung-Keun Kim, Rafal Paprocki, and EuiSeob Jeong.
2020. "Measuring Patent Value Indicators with Patent Renewal Information" Journal of Open Innovation: Technology, Market, and Complexity 6, no. 1: 16.
https://doi.org/10.3390/joitmc6010016
APA Style
Og, J. Y., Pawelec, K., Kim, B. -K., Paprocki, R., & Jeong, E.
(2020). Measuring Patent Value Indicators with Patent Renewal Information. Journal of Open Innovation: Technology, Market, and Complexity, 6(1), 16.
https://doi.org/10.3390/joitmc6010016