Wang, C.-Y.; Kao, T.-C.; Chen, Y.-F.; Su, W.-W.; Shen, H.-J.; Sung, K.-B.
Validation of an Inverse Fitting Method of Diffuse Reflectance Spectroscopy to Quantify Multi-Layered Skin Optical Properties. Photonics 2019, 6, 61.
https://doi.org/10.3390/photonics6020061
AMA Style
Wang C-Y, Kao T-C, Chen Y-F, Su W-W, Shen H-J, Sung K-B.
Validation of an Inverse Fitting Method of Diffuse Reflectance Spectroscopy to Quantify Multi-Layered Skin Optical Properties. Photonics. 2019; 6(2):61.
https://doi.org/10.3390/photonics6020061
Chicago/Turabian Style
Wang, Chiao-Yi, Tzu-Chia Kao, Yin-Fu Chen, Wen-Wei Su, Hsin-Jou Shen, and Kung-Bin Sung.
2019. "Validation of an Inverse Fitting Method of Diffuse Reflectance Spectroscopy to Quantify Multi-Layered Skin Optical Properties" Photonics 6, no. 2: 61.
https://doi.org/10.3390/photonics6020061
APA Style
Wang, C. -Y., Kao, T. -C., Chen, Y. -F., Su, W. -W., Shen, H. -J., & Sung, K. -B.
(2019). Validation of an Inverse Fitting Method of Diffuse Reflectance Spectroscopy to Quantify Multi-Layered Skin Optical Properties. Photonics, 6(2), 61.
https://doi.org/10.3390/photonics6020061