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Journal: Photonics, 2021
Volume: 8
Number: 443
Article:
Interferometric Technique for the Spectral Characterization of High Frequency Current-Modulated Mid-Infrared Semiconductor Lasers
Authors:
by
Marc-Simon Bahr and Marcus Wolff
Link:
https://www.mdpi.com/2304-6732/8/10/443
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