Lawler, G.; Sanwalka, K.; Zhuang, Y.; Yu, V.; Paschen, T.; Robles, R.; Williams, O.; Sakai, Y.; Naranjo, B.; Rosenzweig, J.
Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes. Instruments 2019, 3, 57.
https://doi.org/10.3390/instruments3040057
AMA Style
Lawler G, Sanwalka K, Zhuang Y, Yu V, Paschen T, Robles R, Williams O, Sakai Y, Naranjo B, Rosenzweig J.
Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes. Instruments. 2019; 3(4):57.
https://doi.org/10.3390/instruments3040057
Chicago/Turabian Style
Lawler, Gerard, Kunal Sanwalka, Yumeng Zhuang, Victor Yu, Timo Paschen, River Robles, Oliver Williams, Yusuke Sakai, Brian Naranjo, and James Rosenzweig.
2019. "Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes" Instruments 3, no. 4: 57.
https://doi.org/10.3390/instruments3040057
APA Style
Lawler, G., Sanwalka, K., Zhuang, Y., Yu, V., Paschen, T., Robles, R., Williams, O., Sakai, Y., Naranjo, B., & Rosenzweig, J.
(2019). Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes. Instruments, 3(4), 57.
https://doi.org/10.3390/instruments3040057