Technical Advances and Advanced Applications of Ellipsometry
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: 20 December 2024 | Viewed by 120
Special Issue Editors
Interests: optical properties; ultrafast dynamics in solid state; semiconductors; ferroelectric/ferromagnetic materials; microcavities; nanostructures; Bose-Einstein condensates; lasing; ellipsometry
Special Issues, Collections and Topics in MDPI journals
Interests: ultrafast time-resolved spectroscopic ellipsometry; imaging ellipsometry; semiconductors; phase change materials; nonlinear processes in solid state materials
Special Issue Information
Dear Colleagues,
Over the last few decades (Mueller matrix) spectroscopic ellipsometry has become a standard experimental tool in fundamental research, metrology, and in industrial research and process control. It is widely applied in fields ranging from thin films and coatings, solid state materials, biologic and pharmacologic applications, chemistry and electrochemistry, to complex surfaces and electronics device structures. Typical questions addressed are film thickness and lateral dimensions as well as the shape of micro-and nanostructures; surface properties; the electronic, optical, and vibrational properties of materials and heterostructures and their anisotropy; in situ monitoring of material growth and chemical reactions; chemical composition and lateral structural distributions in biologic matter; and many more.
While further innovative developments regarding the inclusion of magnetic or electric fields, imaging with resolutions below the micrometre scale, wide spectral ranges from terahertz to vacuum ultraviolet, full Mueller matrix including depolarization analysis, and others have already been in the field for several years. Recently, new approaches and technical developments have started to emerge, enabling a much deeper understanding of the physical and chemical properties of modern functional materials as well as new insights into fundamental physics.
This Special Issue aims to collect examples of those developments to provide a base for further advancements as well as information for new users of such techniques. We are pleased to invite you to contribute to this Special Issue and would be grateful for your support of our aims with your esteemed expertise.
We suggest the following ellipsometry topics as the main, but not exclusive, focus:
- (Ultrafast) time-resolved (down to femtoseconds, infrared to extreme ultraviolet) ellipsometry;
- Terahertz (spectroscopic and time-resolved, frequency- as well as time domain-based) ellipsometry;
- Imaging (spectroscopic, time-resolved, far-field and near-filed – atomic resolution);
- Magnetic fields (spin resonance, spin physics, etc.);
- Advanced polarization and depolarization analysis (surfaces, tissues, etc.);
- Advanced anisotropy analysis (optical activity, spatial dispersion, electro-magnetic coupling);
Fast Mueller matrix polarimetry (including in situ).We would like to point out that there is no restriction regarding neither materials nor physical effects.
In this Special Issue, original research articles and reviews are welcome.
Dr. Rüdiger Schmidt-Grund
Dr. Shirly Espinoza
Guest Editors
Manuscript Submission Information
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Keywords
- ellipsometry
- spectroscopy
- imaging
- ultrafast
- in situ
- depolarization
- anisotropy
- Mueller matrix
- near-field spectroscopy
- spin
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