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Optical Sensors for Industrial Inspection and Quality Control

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Optical Sensors".

Deadline for manuscript submissions: 25 April 2025 | Viewed by 109

Special Issue Editors


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Guest Editor
1. Bremer Institut für Angewandte Strahltechnik GmbH, Bremen, Germany
2. Physics Department, Faculty of Science, Aswan University, Aswan, Egypt
Interests: optical inspection; quality control; interferometry; digital holography; phase retrieval; digital and optical wave field manipulation

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Guest Editor
Bremer Institut für Angewandte Strahltechnik GmbH, Bremen, Germany
Interests: optical metrology; light field synthesis; digital holography; shear interferometry

Special Issue Information

Dear Colleagues,

In-line optical metrology has become a key tool for real-time quality control and process monitoring across a wide range of industries, providing precise, non-contact measurements that are essential for modern manufacturing, inspection and diagnostics. Continuous advances in optical sensor technology have expanded the capabilities of these systems to meet the growing demands for greater accuracy, speed and reliability in a wide range of applications.

This Special Issue, entitled "Optical Sensors for Industrial Inspection and Quality Control", aims to bring together cutting-edge research and developments in the field, focusing on both coherent and non-coherent optical metrology techniques. We invite contributions that explore innovative sensor designs, algorithms and applications that demonstrate the versatility and power of optical metrology in industrial and scientific settings.

Prof. Dr. Mostafa Agour
Dr. Claas Falldorf
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • interferometry and shear interferometry
  • holographic and speckle techniques
  • phase retrieval
  • moire and structured illumination techniques
  • deflectometry and image correlation techniques
  • hyperspectral techniques
  • confocal and focus scanning techniques
  • coherence scanning, time-of-flight techniques
  • scattering and diffraction based analysis
  • advanced imaging and signal processing
  • fibre and micro-optical sensors
  • measurement systems using artificial intelligence (smart optical sensors)
  • microstructures, nanostructures and roughness measurement
  • measurement of precision components
  • measurement of optical components and systems
  • additive manufacturing measurement and inspection
  • form measurement/reverse engineering
  • non-destructive testing and defect detection
  • thickness measurement
  • functional surface inspection
  • stress and vibration analysis
  • inspection of renewable energy system components
  • inspection of large objects
  • inspection of 2D material (meta-surfaces)
  • scattering surface and volume inspection
  • measurement systems for Industry 4.0
  • determining material properties and parameters

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Published Papers

This special issue is now open for submission.
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