3.1. Temperature Dependence of Jc
We first examine the temperature dependence, which is of particular relevance for high temperature superconductor (HTS) samples which operate over a wide temperature range. Critical currents only exist between
T = 0, and
T =
Tirr, where
Tirr is an irreversibility temperature beyond which vortices cannot be pinned. We can normalize
and our data falls on the domain
. For temperature dependent data in HTS the form most often employed in experimental analysis is
[
14,
15]. In
Figure 2 we show a measurement of
Jc(
T) which follows this form with
δ = 1. Typically for YBCO films prepared in our laboratory we obtain data with δ ~ 1–2 [
16]. There has been no convincing explanation to date why this functional form is persistently observed for samples with such a variety of microstructures. We can recognize this form as a power law which comes from a constraint of the expectation value,
[
12]. If we maximize the Shannon information entropy using this constraint we obtain using our ansatz for
Jc:
Some data for high temperature superconductor (HTS) samples follows a mixture form [
14,
15],
. From the maximum entropy point of view this is not surprising. It suggests the sample has physical populations of defects which are sufficiently different in their overall properties that they create distinct constraints which can be resolved in the macroscopic experiment. It is therefore a natural extension of the model. For example, at low temperature we may have an effective physical population of defects which is statistically distinct from the physical population effective at high temperatures. In low temperature superconductors (LTS) the form
has sometimes been used to fit data [
1]. At temperatures close to
Tc, and for the limited range of LTS temperature data, this form can be difficult to distinguish from Equation (1). We therefore consider we have a well validated maximum entropy expression for
Jc(
T). The physical meaning of the constraint is discussed in
Section 4.
Figure 2.
Jc(T) for a metal-organic deposited YBCO thin film, 1 μm thickness.
Figure 2.
Jc(T) for a metal-organic deposited YBCO thin film, 1 μm thickness.
3.2. Magnetic Field Dependence of Jc
There are three possible sources of field in a measurement of
Jc: external sources,
Bex; transport current self-field (the field generated by the transport current itself),
Bsf; and equilibrium magnetization currents producing fields of the order
Bc1. The maximum field for the measurement is the irreversibility field,
Birr; the field at which it is no longer possible for the sample to sustain a measurable critical current,
i.e. Jc = 0. External fields are usually significantly larger than
Bc1 and
Bsf, so that experimental data falls in the range
Bc1 <<
Bsf <<
Bext <
Birr. If we ignore the smaller field sources for the moment, then
and
and we have
on the domain
. Rather than a direct analysis of
it is common to plot the pinning force,
, against
B or
b, forming a normalized plot of flux pinning force
versus (normalized) field for
. It has been known for the past 40 years that such a plot takes the form
[
1,
2,
17,
18]. This is true of both LTS and HTS samples. In the words of Campbell and Evetts ([
2] p.159), “A frequent and striking feature of these curves is that over a wide range of microstructures, field and temperatures they have the same shape”. This was written before it was observed that the high temperature superconductors and MgB
2 also obey this form [
19]. Various explanations have been offered for this, but without consensus. The same shape implies that data over multiple conditions can be scaled to a common curve, a useful property for constructing empirical models used in engineering of devices [
20].
We can notice that this form is a beta distribution; the multiplication by
b or
B, doesn’t alter this form. The beta distribution can be derived from maximum entropy using logarithmic constraints,
and
[
12]. For the field dependence we thus have the equation:
where
, and
where Ψ is the digamma function.
An example of the ability to scale data under different conditions to a common curve is shown in
Figure 3 for a Bi-2223 tape sample, manufactured by AMSC (Devens, MA, USA). Here we have scaled data for different field directions to show the common form. The irreversibility fields used in the scaling range from
Birr= 1.73 T at 0° (field perpendicular to the plane of the sample) to
Birr= 11.1 T at 90° (field parallel to the plane of the tape). The Bi-2223 material is highly anisotropic therefore the accommodation of vortices to the pinning landscape must be very different at the different angles. The scaling to a common curve emphasizes the statistical nature of the macroscopic response. We discuss the implications for analyzing the sources of pinning in more detail in
Section 4.
One circumstance which is known to occur [
1] in which Equation (2) fails in the form
, is when the data is better fitted with two or more components,
i.e. weighted contributions,
. Again this is not surprising, suggesting the sample has physical populations of defects which are sufficiently different in their overall properties that the outcome is a mixture distribution. In [
10] we give an example where
Jc(
B) data with a secondary maximum at intermediate fields (a so-called “peak effect”) can be described using this form.
A more accurate fitting to the model should also take into account the smaller field sources which we have ignored, so that is a measure of the field in the sample. For example, we could rescale the B axis to account for self-fields. As this mainly affects the low field region it probably has little practical effect on the fitting parameters obtained.
The maximum entropy distribution for field dependence is thus well established in the superconductivity literature. We give a physical interpretation of the constraints in
Section 4, and we also discuss what the maximum entropy viewpoint implies for the interpretation of experimental results.
Figure 3.
Flux pinning force as a function of applied field for a Bi-2223 wire sample measured at 77 K. The data for 4 different field angles, θ = 0 (perpendicular field), 30°, 60° and 90° (parallel field) are scaled to lie on a common curve. The Beta distribution parameters used to fit the common curve are, α=1.8, β = 9.6.
Figure 3.
Flux pinning force as a function of applied field for a Bi-2223 wire sample measured at 77 K. The data for 4 different field angles, θ = 0 (perpendicular field), 30°, 60° and 90° (parallel field) are scaled to lie on a common curve. The Beta distribution parameters used to fit the common curve are, α=1.8, β = 9.6.
3.3. Out-of-Plane Field Angular Dependence of Jc Under Maximum Lorentz Force
For a planar sample lying in the
xy plane, with current direction
,
θ is the angle of the magnetic field in the
yz plane, (i.e.
,
θ = 90° for field direction parallel to
) and
ϕ is the angle in the
xy plane (i.e.
,
ϕ = 90°for field direction parallel to
). We consider first the case where the magnetic field is kept perpendicular to the current direction (
ϕ = 0, maximum Lorentz force configuration). We maximize
where
, with
, subject to chosen constraints <
g(θ)>. If there are no constraints we obtain a uniform distribution:
For fully isotropic superconductors, for example, a round wire of the LTS conductor Nb-Ti, such an angular dependence is a trivial result. Of interest is whether this result has wider applicability. In
Figure 4 we show
Jc(
θ) of a thin film HTS YBCO sample prepared by metal organic deposition [
16]. To a good approximation we have a uniform distribution of critical current. This is a surprising result because the sample has many defects and pinning structures which are aligned with the crystal axes. Particularly the sample has stacking faults which are aligned with the film surface (90° direction)—normally these are correlated with the observation of strong peaks in
Jc(
θ) [
21]. The sample also has grain boundaries, twin planes and twin plane intersections aligned normal to the film surface (0° direction) which are often correlated with the observation of
Jc(
θ) maxima. Even an intrinsically isotropic low temperature superconductor film usually has a peak in the direction parallel to the surface due to surface pinning as shown in the next section. In anisotropic high temperature superconductors the vortices themselves are dimensionally anisotropic due to the electronic mass anisotropy. Hence the local pinning forces are often presumed to always be anisotropic with
θ and in spite of this, here we observe an almost isotropic response of the critical current.
Figure 4.
Isotropic Jc(θ) observed in an anisotropic high temperature superconductor YBCO, (a) 77 K, (b) 65 K, data (▼, Δ), fit ().
Figure 4.
Isotropic Jc(θ) observed in an anisotropic high temperature superconductor YBCO, (a) 77 K, (b) 65 K, data (▼, Δ), fit ().
In the experiments of
Figure 4 the many factors which result in a vortex being pinned or not have averaged, such that there is no dependence on the angle of the applied field. This is a striking example of the loss of information on the microscopic state when making a macroscopic measurement. That is to say, the configurations of the pinned vortices must be quite different across all angles but this information is lost to the experimentalist. No deterministic model of
Jc starting from a model of
Fp which included anisotropic pinning structures would ever be likely to predict an angle independent
Jc. The common assumption is that anisotropic structures must produce an anisotropic
Jc [
22], but here this is demonstrated to be false.
A more detailed analysis of when peaks are observed in these samples depending on the relative density of correlated defects is given in [
16]. The point we are making here is that Equation 3a, is an important and valid maximum entropy distribution for describing
Jc(
θ). It is also highlights the necessity of an epistemic model for critical currents in analyzing data.
It is more usual when measuring thin film superconductors to observe peaks in
Jc(
θ) due to vortices’ interactions with pinning structures correlated with the crystal axes. For each pinned vortex
i the vortex must be stationary over total pinned lengths
yi and
zi. The macroscopic angle at which the vortex is pinned satisfies
. Rather than the summation of pinned vortex segments creating a mean angle
which is the relevant information, we consider the possibility it is the mean
which is relevant. Similarly, if a variance is constrained by the pinning landscape it is
. (In our discussions we could equally use
etc, as the constraints for our derivation of the distributions. The choice of using
z/y as the variable is to maintain consistency with the derivation in our earlier papers, particularly [
8]. The original choice of
z/y was made so that <
z/
y> = 0 positions the peak of the distribution at
θ = 90° which is the common occurrence in HTS samples.)
This implies the most uniform distribution to describe correlated pinning is the improper distribution of a uniform p(z/y) on the domain . We can imagine this distribution as describing the pinning arising from an infinite square lattice of correlated pins in the y-z plane, in which any value of z/y is equally likely.
With constraints on the mean <
z/y>, and variance <
((z/y) − <
z/y>)
2>, it is well known that maximization of the information entropy gives a Gaussian distribution in
z/y. By a simple transformation of random variables to the
θ variable,
, with
, we obtain:
We call this an “angular-Gaussian”, where the scale parameter σ
2 is the variance in the Cartesian coordinates, and we have chosen <
z/y> = 0. This equation has the interesting property of bifurcating at
to give three extrema. Some other interesting properties of the equation are given in [
9].
A further possibility is that the distribution of
is “heavy tailed”. That is, we obtain a Lorentzian distribution in
z/y. This distribution (in a discrete truncated form) has been considered from an information theory point of view by Carraza [
23,
24] as arising from a constraint on the variance alone. Real measurements will always occur at some finite
z/y, so to give a convenient closed form we transform a continuous Lorentzian distribution to the angular domain giving:
We call this an “angular-Lorentzian” with scale parameter γ. Note this equation reduces to Equation (3a) in the case γ = 1. The distributions given by Equations (3b) and (3c) can reflect a sum of underlying distributions through the usual rules of convolution,
i.e. or
[
9]. This is one way in which the method of maximum entropy shows how contributions from different populations of pinning defects are summed. For example, a
Jc peak can be broadened by interactions with one population of defects giving a peak with scale factor σ
1, or by interaction with a second population giving scale factor σ
2, or by both giving
. The second way the maximum entropy method sums the contribution from different pinning populations is through mixture distributions. In our experiments we can observe multiple contributions from Equations (3a), (3b) and (3c), which reflect different sets of constraints operating simultaneously across the angular domain.
To illustrate this effect we show in
Figure 5 a nanostructured LTS Nb film at two different field strengths. Experimental details of this sample are given elsewhere [
9]. For both field strengths shown we are able to identify three components with parameters as shown in
Table 1. The choice of components and fitting has been done “by eye” and with the assistance of a least squares fitting program. In principle this fitting and model selection should be done using a maximum entropy procedure such as outlined in [
25] or other Bayesian model selection procedure.
This data shows two striking effects which can be accounted for by the maximum entropy description but are not predicted by any deterministic model. At 0.1 T, the angular dependence is flat around the region
θ = 0°, despite the sample having correlated pinning structures oriented in this direction. From Equation (3c) we know it is possible for correlated pinning to give a flat angular response through the value γ = 1. At 0.2 T, we see the emergence of “shoulders” at
θ ~ ±60°. It is difficult to foresee how a deterministic model would ever predict a
Jc peak which is not aligned with the direction of correlated pinning, but this comes quite naturally from Equation (3b). Further examples of the use of these equations to explain
Jc(
θ) from complex pinning structures are given in [
7,
8,
9,
10,
26,
27].
Figure 5.
Jc(
θ) at 5 K for a nanostructured Nb thin film incorporating an array of vertical columnar pores: experiment (■), full fit (
), fit components (
,
,
,
). The fitting parameters for these data are summarized in
Table 1.
Figure 5.
Jc(
θ) at 5 K for a nanostructured Nb thin film incorporating an array of vertical columnar pores: experiment (■), full fit (
), fit components (
,
,
,
). The fitting parameters for these data are summarized in
Table 1.
Table 1.
Parameters of fit components in
Figure 5.
Table 1.
Parameters of fit components in Figure 5.
| | 0.1 T | 0.2 T |
---|
Uniform () | J0 | 5.33 | ― |
Gaussian* () | J0 | ― | 1.75 |
σ | ― | 1.0 |
Gaussian () | J0 | 0.65 | 1.93 |
σ | 0.23 | 0.45 |
Gaussian () | J0 | 0.18 | 0.225 |
σ | 0.045 | 0.04 |
3.6. Higher Order Constraints in Jc(θ)
The Equations (3a), (3b) and (3c), with suitable modifications, account for almost all
Jc(
θ) and
Jc(
ϕ) data in the literature. One exception is for samples which exhibit a phenomenon known as channeling. In this case there exists a preferred direction in which the vortices will move as there is only weak pinning available in this direction. An excellent model system for this effect are HTS films grown on vicinal-cut crystal substrates in which a force component on the vortices is directed along the
ab-planes of the crystal [
31,
32]. The flux pinning is only weak in this direction as any effect of the intrinsic pinning or the pinning due to stacking faults within the layered structure is avoided.
Following the results of Carazza [
23,
24] we can consider the case where a fourth moment in
z/y is defined. Carazza gives the solution
if only second and fourth moments in
x are defined. Substituting
z/y and transforming to the angular domain with the correct normalization gives:
We call this an “angular quartic” distribution. In
Figure 9 we have fitted data for a YBCO film on a vicinal substrate with a reported 4° miscut angle. The data can be fitted with two components, an angular Lorentzian with a peak centered at
θ0 = 5.3° and an angular quartic function centered at
θ0 = 0°. We are thus claiming that there exist two sets of constraints which affect the experiment. The effect of the channeling phenomenon is only present in one of these sets.
The physics of channeling is thus analogous to a random walk in a quartic potential in
z/y. That is, the magnitude of the critical current at
z/y is analogous to the probability of the position of a particle undergoing a random walk with position
w =
z/y. This is true to the extent that at high temperatures the quartic term effectively disappears and there is no channeling minimum in
Jc [
31,
32].
Figure 9.
Jc(
θ) at 20 K, 1 T for a YBCO thin film grown on a vicinal substrate with a 4° miscut angle. Data from [
31] experiment (■), full fit (
), fit components (
,
). The fitting parameters for these data are summarized in
Table 5.
Figure 9.
Jc(
θ) at 20 K, 1 T for a YBCO thin film grown on a vicinal substrate with a 4° miscut angle. Data from [
31] experiment (■), full fit (
), fit components (
,
). The fitting parameters for these data are summarized in
Table 5.
Table 5.
Parameters of fit components in
Figure 9.
Table 5.
Parameters of fit components in Figure 9.
| | 1 T |
---|
Lorentzian () | J0 | 1.76 |
γ | 0.85 |
θ0 | 5.3 |
Quartic () | J0 | 0.215 |
Α | 0.20 |
Β | 0.016 |
θ0 | 0 |