Outlier Profiles of Atomic Structures Derived from X-ray Crystallography and from Cryo-Electron Microscopy
Abstract
:1. Introduction
2. Results
2.1. Eleven Sets of Atomic Structures Derived from X-ray and Cryo-EM Data
2.2. HBOS Distribution of X-ray and Cryo-EM datasets
2.3. Histogram-based Outliers of Different Residue Types
2.4. HBOS Outliers on Secondary Structures
3. Materials and Methods
3.1. Datasets
3.2. Histogram-Based Outlier (HBOS)
3.3. Outliers in PDB Validation Reports
3.4. Identification of Outlier Secondary Structures
4. Conclusions
Supplementary Materials
Author Contributions
Funding
Conflicts of Interest
References
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Sample Availability: Samples of the compounds not are available from the authors. |
Dataset | Resolution | Number of Proteins | Number of Obsolete Entries | Release Time |
---|---|---|---|---|
X-ray-1.5 | <1.5 Å | 9131 | 2 | before 3/31/2018 |
X-ray-1.5–2.0 | 1.5–2.0 Å | 5000 | 0 | before 3/31/2018 |
X-ray-2.0–2.5 | 2.0–2.5 Å | 5000 | 2 | before 3/31/2018 |
X-ray-2.5–3.0 | 2.5–3.0 Å | 5000 | 22 | before 3/31/2018 |
X-ray-3.0–3.5 | 3.0–3.5 Å | 6833 | 138 | before 3/31/2018 |
EM-0-4-2016 | <4.0 Å | 213 | 47 | before 12/31/2016 |
EM-4-6-2016 | 4–6 Å | 161 | 19 | before 12/31/2016 |
EM-0-4-2018 | <4.0 Å | 286 | 59 | 1/1/2017 to 3/31/2018 |
EM-4-6-2018 | 4–6 Å | 158 | 11 | 1/1/2017 to 3/31/2018 |
EM-0-4-2019 | <4.0 Å | 1175 | 138 | 4/1/2018 to 12/31/2019 |
EM-4-6-2019 | 4–6 Å | 498 | 52 | 4/1/2018 to 12/31/2019 |
Loop/Turn | Sheet | Helix | - | T | S | Helix | Sheet | ||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
- | S | T | B | E | G | H | I | ||||||
ARG | 35 | 13 | 5 | 0 | 0 | 23 | 1 | 0 | 45.45% | 6.49% | 16.88% | 31.17% | 0.00% |
ASN | 29 | 16 | 0 | 0 | 9 | 3 | 0 | 0 | 50.88% | 0.00% | 28.07% | 5.26% | 15.79% |
ASP | 50 | 11 | 7 | 0 | 5 | 5 | 4 | 0 | 60.98% | 8.54% | 13.41% | 10.98% | 6.10% |
CYS | 27 | 12 | 1 | 2 | 6 | 0 | 14 | 0 | 43.55% | 1.61% | 19.35% | 22.58% | 12.90% |
GLN | 132 | 59 | 25 | 0 | 7 | 8 | 61 | 0 | 45.21% | 8.56% | 20.21% | 23.63% | 2.40% |
GLU | 182 | 65 | 66 | 0 | 5 | 1 | 76 | 0 | 46.08% | 16.71% | 16.46% | 19.49% | 1.27% |
HIS | 2 | 4 | 0 | 0 | 7 | 1 | 2 | 0 | 12.50% | 0.00% | 25.00% | 18.75% | 43.75% |
ILE | 176 | 59 | 30 | 5 | 69 | 1 | 83 | 1 | 41.51% | 7.08% | 13.92% | 20.05% | 17.45% |
LEU | 1576 | 614 | 548 | 38 | 509 | 134 | 990 | 32 | 35.49% | 12.34% | 13.83% | 26.03% | 12.32% |
LYS | 76 | 27 | 17 | 0 | 0 | 0 | 20 | 0 | 54.29% | 12.14% | 19.29% | 14.29% | 0.00% |
MET | 63 | 23 | 13 | 18 | 2 | 0 | 27 | 0 | 43.15% | 8.90% | 15.75% | 18.49% | 13.70% |
PHE | 10 | 2 | 22 | 0 | 13 | 4 | 42 | 0 | 10.75% | 23.66% | 2.15% | 49.46% | 13.98% |
PRO | 122 | 38 | 30 | 0 | 1 | 38 | 38 | 0 | 45.69% | 11.24% | 14.23% | 28.46% | 0.37% |
SER | 26 | 2 | 7 | 0 | 1 | 0 | 41 | 0 | 33.77% | 9.09% | 2.60% | 53.25% | 1.30% |
THR | 31 | 7 | 1 | 0 | 1 | 0 | 1 | 0 | 75.61% | 2.44% | 17.07% | 2.44% | 2.44% |
TRP | 8 | 3 | 2 | 0 | 0 | 0 | 13 | 0 | 30.77% | 7.69% | 11.54% | 50.00% | 0.00% |
TYR | 26 | 17 | 13 | 4 | 45 | 0 | 12 | 0 | 22.22% | 11.11% | 14.53% | 10.26% | 41.88% |
VAL | 74 | 39 | 25 | 0 | 12 | 0 | 7 | 0 | 47.13% | 15.92% | 24.84% | 4.46% | 7.64% |
Total | 2645 | 1011 | 812 | 67 | 692 | 218 | 1432 | 33 | 38.28% | 11.75% | 14.63% | 24.36% | 10.98% |
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Chen, L.; He, J. Outlier Profiles of Atomic Structures Derived from X-ray Crystallography and from Cryo-Electron Microscopy. Molecules 2020, 25, 1540. https://doi.org/10.3390/molecules25071540
Chen L, He J. Outlier Profiles of Atomic Structures Derived from X-ray Crystallography and from Cryo-Electron Microscopy. Molecules. 2020; 25(7):1540. https://doi.org/10.3390/molecules25071540
Chicago/Turabian StyleChen, Lin, and Jing He. 2020. "Outlier Profiles of Atomic Structures Derived from X-ray Crystallography and from Cryo-Electron Microscopy" Molecules 25, no. 7: 1540. https://doi.org/10.3390/molecules25071540
APA StyleChen, L., & He, J. (2020). Outlier Profiles of Atomic Structures Derived from X-ray Crystallography and from Cryo-Electron Microscopy. Molecules, 25(7), 1540. https://doi.org/10.3390/molecules25071540