Cho, D.; Ham, J.; Oh, J.; Park, J.; Kim, S.; Lee, N.-K.; Lee, B.
Detection of Stress Levels from Biosignals Measured in Virtual Reality Environments Using a Kernel-Based Extreme Learning Machine. Sensors 2017, 17, 2435.
https://doi.org/10.3390/s17102435
AMA Style
Cho D, Ham J, Oh J, Park J, Kim S, Lee N-K, Lee B.
Detection of Stress Levels from Biosignals Measured in Virtual Reality Environments Using a Kernel-Based Extreme Learning Machine. Sensors. 2017; 17(10):2435.
https://doi.org/10.3390/s17102435
Chicago/Turabian Style
Cho, Dongrae, Jinsil Ham, Jooyoung Oh, Jeanho Park, Sayup Kim, Nak-Kyu Lee, and Boreom Lee.
2017. "Detection of Stress Levels from Biosignals Measured in Virtual Reality Environments Using a Kernel-Based Extreme Learning Machine" Sensors 17, no. 10: 2435.
https://doi.org/10.3390/s17102435
APA Style
Cho, D., Ham, J., Oh, J., Park, J., Kim, S., Lee, N. -K., & Lee, B.
(2017). Detection of Stress Levels from Biosignals Measured in Virtual Reality Environments Using a Kernel-Based Extreme Learning Machine. Sensors, 17(10), 2435.
https://doi.org/10.3390/s17102435