Research on the Weld Position Detection Method for Sandwich Structures from Face-Panel Side Based on Backscattered X-ray
Abstract
:1. Introduction
2. Detection Method and Characteristics of X-ray Intensity Signal
3. Experimental System for Weld Detection
4. Acquisition and Processing of the Backscattered X-ray Intensity Signal
4.1. Signal Acquisition
4.2. Signal Processing
4.2.1. Denoising
- Suppose the original signal is S(n), n ∈ [1,M], select a data queue S(P) with a length of P from S(n), where P is the number of sampling points acquired in single scanning period, S(P) = {S1, S2, S3, …, SP}.
- Read into the select sampling signal S(P), then do wavelet packet decomposition for L layers.
- Look for the best threshold to quantize the coefficients of wavelet packets.
- Reconstruct the signal with the best basis of wavelet packets, and then get the denoised X-ray intensity signal S’(P).
- Compare all data of S’(P) to find the maximum Si’Si’ = max{S1’, S2’, S3’, …, SP’}.
- Correct the denoised signal S’(P).While scanning in the positive X-direction, the sample signals acquired after the maximum sampling signal (Si’) are multiplied by the correction coefficient.S”(P) = {S1’, S2’, S3’, …, Si − 1’, Si’, Si + 1’ × α, …, SP’ × α}The coefficient is obtained by minimizing the sum of the differences of symmetric signals about the maximum value.While scanning in the negative X-direction, the sample signals acquired before the maximum sampling signal (Si’) are multiplied by the correction coefficient.S”(P) = {S1’ × α, S2’ × α, S3’ × α, …, Si − 1’ × α, Si’, Si + 1’, …, SP’}
4.2.2. Curve Fitting
4.2.3. The Analysis of the Detection Errors
5. Detection Process Parameter Optimization
6. Weld Position Detection Experiments
6.1. Accuracy of Detection
6.2. Dynamic Performance of Detection
7. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Processing Algorithm | Absolute Error Before Correction (mm) | Absolute Error After Correction (mm) |
---|---|---|
Origin | 0.916 | 0.105 |
Average filter | 0.907 | 0.086 |
Kalman filter | 1.029 | 0.214 |
Wavelet packet | 0.838 | 0.032 |
Parameter Name | Parameter Value |
---|---|
Material type | AA6061 Aluminum |
Thickness of cover panel (mm) | 3 |
Thickness of core panel (mm) | 3 |
Parameter Name | Parameter Value |
---|---|
X-ray photon energy E0 (keV) | 50/60/70/80 |
X-ray beam intensity N0 (counts) | 2 × 107/5 × 107/7 × 107/108 |
Incident beam diameter (mm) | 2 |
Diameter of the sensitive end of the detector (mm) | 50 |
Scattering angle (°) | 120 |
Distance between source and face panel (mm) | 200 |
Parameter Name | Parameter Value |
---|---|
X-ray photon energy (keV) | 60–70 |
X-ray beam intensity (counts) | 108 |
Incident beam diameter (mm) | 2 |
Diameter of the sensitive end of the detector (mm) | 50 |
Scattering angle (°) | 120 |
The distance between source and face panel (mm) | 200 |
The distance between detector and T-joint (mm) | 120 |
Processing Algorithm | Max Absolute Error (mm) | Max Error to Thickness of Core Panel | Standard Error (mm) | Standard Error to Thickness of Core | Standard Deviation (mm) |
---|---|---|---|---|---|
Origin signal | −1.527 | 50.9% | 0.563 | 18.8% | 0.542 |
Wavelet packet | −0.287 | 9.57% | 0.205 | 6.83% | 0.206 |
Processing Algorithm | Max Absolute Error (mm) | Max Error to Thickness of Core Panel | Standard Error (mm) | Standard Error to Thickness of Core | Standard Deviation (mm) |
---|---|---|---|---|---|
Origin signal | −1.242 | 41.4% | 0.453 | 15.1% | 0.414 |
Wavelet packet | −0.340 | 11.3% | 0.221 | 7.37 | 0.223 |
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Wei, A.; Chang, B.; Xue, B.; Peng, G.; Du, D.; Han, Z. Research on the Weld Position Detection Method for Sandwich Structures from Face-Panel Side Based on Backscattered X-ray. Sensors 2019, 19, 3198. https://doi.org/10.3390/s19143198
Wei A, Chang B, Xue B, Peng G, Du D, Han Z. Research on the Weld Position Detection Method for Sandwich Structures from Face-Panel Side Based on Backscattered X-ray. Sensors. 2019; 19(14):3198. https://doi.org/10.3390/s19143198
Chicago/Turabian StyleWei, Angang, Baohua Chang, Boce Xue, Guodong Peng, Dong Du, and Zandong Han. 2019. "Research on the Weld Position Detection Method for Sandwich Structures from Face-Panel Side Based on Backscattered X-ray" Sensors 19, no. 14: 3198. https://doi.org/10.3390/s19143198
APA StyleWei, A., Chang, B., Xue, B., Peng, G., Du, D., & Han, Z. (2019). Research on the Weld Position Detection Method for Sandwich Structures from Face-Panel Side Based on Backscattered X-ray. Sensors, 19(14), 3198. https://doi.org/10.3390/s19143198