Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique
Abstract
:1. Introduction
2. Postpeak Value for PECT
2.1. Principle of Postpeak Value
2.2. Determination of Postpeak Value
- Step 1:
- A calibration plate with the same material and thickness to the plate under test is fabricated. The deepest reverse notch is fabricated on the basis of the requirement (the position of the postpeak value delays with the increase of the remaining ligament. In a practical application, to improve the detectability of deep reverse defect, a compromise is needed. Normally, a requested deepest defect is announced according to the standard. Thus, the position of the postpeak value of the deepest reverse defect is fixed in detection).
- Step 2:
- PECT probe is placed on the position without defect measuring reference signal .
- Step 3:
- PECT probe is placed on the position of defect measuring defect signal . Detection sensitivity S of the response signal changing with time is calculated as Equation (9). Then, the biggest value in the curve is the postpeak value:
3. Experiment Verification
3.1. Experiment Device
3.2. Results and Discussion
4. Defect Classification Method Using Postpeak Value
4.1. Classification Method Procedure
- Step 1:
- The postpeak value for a certain detection is determined in advance according to the procedure in Section 2.2.
- Step 2:
- When detecting defects, in each scanning point both peak and postpeak values are extracted.
- Step 3:
- The Bx curves of the measured values vs. X position are drawn.
- Step 4:
- The difference value of the minimal values in the Bx curves of the peak and postpeak values are compared. If the difference value is positive, a surface defect exists. If the difference value is negative, a reverse defect exists.
4.2. Classification Method Verification
5. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Parameter | Length (mm) | Width (mm) | Height (mm) | Thickness (mm) | Conductivity (S/m) | Relative Permeability |
---|---|---|---|---|---|---|
Value | 60 | 15 | 45 | 8 | 0.15 | 2000 |
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Ge, J.; Yang, C.; Wang, P.; Shi, Y. Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors 2020, 20, 3390. https://doi.org/10.3390/s20123390
Ge J, Yang C, Wang P, Shi Y. Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors. 2020; 20(12):3390. https://doi.org/10.3390/s20123390
Chicago/Turabian StyleGe, Jiuhao, Chenkai Yang, Ping Wang, and Yongsheng Shi. 2020. "Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique" Sensors 20, no. 12: 3390. https://doi.org/10.3390/s20123390
APA StyleGe, J., Yang, C., Wang, P., & Shi, Y. (2020). Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors, 20(12), 3390. https://doi.org/10.3390/s20123390