Ruiz-Lopez, M.; Mehrjoo, M.; Keitel, B.; Plönjes, E.; Alj, D.; Dovillaire, G.; Li, L.; Zeitoun, P.
Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy. Sensors 2020, 20, 6426.
https://doi.org/10.3390/s20226426
AMA Style
Ruiz-Lopez M, Mehrjoo M, Keitel B, Plönjes E, Alj D, Dovillaire G, Li L, Zeitoun P.
Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy. Sensors. 2020; 20(22):6426.
https://doi.org/10.3390/s20226426
Chicago/Turabian Style
Ruiz-Lopez, Mabel, Masoud Mehrjoo, Barbara Keitel, Elke Plönjes, Domenico Alj, Guillaume Dovillaire, Lu Li, and Philippe Zeitoun.
2020. "Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy" Sensors 20, no. 22: 6426.
https://doi.org/10.3390/s20226426
APA Style
Ruiz-Lopez, M., Mehrjoo, M., Keitel, B., Plönjes, E., Alj, D., Dovillaire, G., Li, L., & Zeitoun, P.
(2020). Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy. Sensors, 20(22), 6426.
https://doi.org/10.3390/s20226426