Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement
Abstract
:1. Introduction
2. Experiments
2.1. Vibration Measurement Conditions for the Environment and Equipment Operation
2.2. Vibration Measurement
3. Results and Suggestions
3.1. Characterization of Vibration
3.2. Design Suggestions
3.2.1. Environmental Vibration Control
3.2.2. Internal Vibration Control
4. Conclusions
- The configuration of the measuring instruments and the selection of sensors are discussed to measure the extremely small vibrations in an SEM and its environment, and an improved arrangement of the general configuration of the SEM equipment is proposed.
- An attempt is made to quantify the image patterns measured with the SEM; the post-processing computer and the main body of the SEM are separated, and the lower structure supporting the main body of the SEM are reinforced to reduce vibrations in this study. A mount selection guide for the dual elastic mount configuration is also presented. The proposed configuration is obtained by analyzing the measured image patterns and vibrations of the lower mount on the SEM.
- Design changes and mounting placements are proposed based on a review of the results of impact tests and simulations performed on the top mounted electron gun and mounting supports for the dual elastic mounting configuration. Based on the current design, structural changes are proposed such that the natural frequency in the direction of rotation will occur after the natural frequency in the vertical direction.
Author Contributions
Funding
Conflicts of Interest
Appendix A. Selection of Accelerometer for Measurement of Environmental Vibration
Appendix B. VC-Curve
Curve Criterion | Amplitude (1) μm/s (μin/s) | Detail Size (2) μm | Description of Use |
---|---|---|---|
Workshop (ISO) | 800 (32,000) | N/A | Distinctly perceptible vibration. Appropriate for workshops and non-sensitive areas. |
Office (ISO) | 400 (16,000) | N/A | Perceptible vibration. Appropriate for offices and non-sensitive areas. |
Residential Day (ISO) | 200 (8000) | 75 | Barely perceptible vibration. Appropriate for sleep areas in most instances. Usually adequate for computer equipment, hospital recovery rooms, semiconductor probe test equipment, and microscopes less than 40×. |
Op. Theatre (ISO) | 100 (4000) | 25 | Vibration not perceptible. Suitable in most instances for surgical suites, microscopes to 100×, and for other equipment with low sensitivity. |
VC-A | 50 (2000) | 8 | Adequate in most instances for optical microscopes up to 400×, microbalances, optical balances, proximity, and projection aligners, etc. |
VC-B | 25 (1000) | 3 | Appropriate for inspection and lithography (including steppers) to line widths of 3 μm. |
VC-C | 12.5 (500) | 1–3 | Appropriate standard for optical microscopes up to 1000×, inspection and lithography inspection equipment (including moderately sensitive electron microscopes), to 1 μm detail size, and thin film transistor liquid crystal display (TFT-LCD) stepper/scanner processes. |
VC-D | 6.25 (250) | 0.1–0.3 | Suitable in most instances for the most demanding equipment including electron microscopes (transmission electron microscopes (TEMs) and scanning electron microscopes (SEMs)) and E-Beam systems. |
VC-E | 3.12 (125) | <0.1 | A challenging criterion to achieve. Assumed to be adequate for the most demanding sensitive systems including long path, laser-based, and small target systems; E-Beam lithography systems working at nanometer scales; and other systems requiring extraordinary dynamic stability. |
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Normal Operational Vibration | Extreme Environmental Vibration | |||||
---|---|---|---|---|---|---|
x-axis | y-axis | z-axis | x-axis | y-axis | z-axis | |
w/o mount | VC-A | VC-B | VC-B | Workshop | Workshop | Workshop |
White (9.8 × 105 N/m) | VC-B | VC-B | VC-A | Office | Office | Workshop |
Black #1 (8.8 × 105 N/m) | VC-C | VC-B | VC-C | Residential | Residential | Office |
Black #2 (10.1 × 105 N/m) | VC-B | VC-B | VC-A | Office | Residential | Office |
Electron Gun | Rubber Mount | Tube | ||||
---|---|---|---|---|---|---|
Stiffness | Damping | Stiffness | Damping | |||
Mass, M | 40 kg | Vertical Direction, (kv, cv) | 4.38 × 104 N/m | 62.9 N·s/m | - | - |
Moment of Inertia, Ixx | 0.65 kgm2 | X-Rotational Direction, (kϴx, cϴx) | 1.58 × 103 Nm/rad | 2.3 Nm·s/rad | 1.89 × 102 Nm/rad | 0.1 Nm·s/rad |
Moment of Inertia, Iyy | 0.65 kgm2 | Y-Rotational Direction, (kϴy, cϴy) | 0.84 × 103 Nm/rad | 1.2 Nm·s/rad | 3.44 × 102 Nm/rad | 0.1 Nm·s/rad |
Original | Suggested | |||
---|---|---|---|---|
Resonance | Rank | Resonance | Rank | |
ϴy | 6.8 Hz | 1 | 9.4 Hz | 2 |
ϴx | 8.3 Hz | 2 | 11.6 Hz | 3 |
z | 12.9 Hz | 3 | 7.4 Hz | 1 |
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Shin, Y.-H.; Moon, S.-J.; Kim, Y.-J.; Oh, K.-Y. Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement. Sensors 2020, 20, 2277. https://doi.org/10.3390/s20082277
Shin Y-H, Moon S-J, Kim Y-J, Oh K-Y. Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement. Sensors. 2020; 20(8):2277. https://doi.org/10.3390/s20082277
Chicago/Turabian StyleShin, Yun-Ho, Seok-Jun Moon, Yong-Ju Kim, and Ki-Yong Oh. 2020. "Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement" Sensors 20, no. 8: 2277. https://doi.org/10.3390/s20082277
APA StyleShin, Y. -H., Moon, S. -J., Kim, Y. -J., & Oh, K. -Y. (2020). Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement. Sensors, 20(8), 2277. https://doi.org/10.3390/s20082277