RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults
Abstract
:1. Introduction
2. Problem Formulation
3. Notation
4. Analysis of the Estimation Error and Residual
4.1. Effects of Noise and Faults on the Estimate
4.2. Effects of Noise and Faults on the Measurement Residual
4.3. Fault Decisions
5. Integrity Risk Evaluation
5.1. Hypothesis Probabilities
5.2. Evaluating
6. Failure Mode Slope
7. Best and Worst-Case Faults
- Best Case:
- For any fault that has and , the fault direction . In this case, the numerator is zero and the failure mode slope Physically, this means that the fault has absolutely no impact on the state estimate.
- Worst Case:
- For any fault that has and , the fault direction . In this case, the denominator is zero and the failure mode slope Physically this means that the fault has no impact on the residual. Therefore, the residual test cannot detect it.
8. Single, Double, Multi-Measurement Faults
8.1. Single-Measurement Faults
8.2. Double-Measurement Faults
8.3. Multi-Measurement Faults
8.4. Undetectable Faults
8.5. Effect of Number of Faults on Failure Mode Slope
- (a)
- (b)
- As h increases toward , the numerator in Equation (40) is bounded above by the squared reciprocal of the smallest singular value (i.e., ), while the (worst-case) denominator can decrease toward zero, which causes the failure mode slope to increase toward infinity.
- (c)
- When , is singular. Therefore, there is at least one fault direction, as defined in Equation (57), that will make . As a result, .
- (d)
- For , and . This has eigenvalues values that are one and n eigenvalues that are zero. The eigenvectors corresponding to the zero eigenvalues are in , which is the null space of . As stated in Section 6, any fault in is not detectable from the residual and has . In particular, the worst-case fault direction is , which is undetectable and affects the state estimation error the most. This is the same solution as that in Equation (57).
9. Effect of Fault on Horizontal Position
10. Example Discussion
10.1. Fixed Number of Measurements
10.2. Multi-Measurement Faults: Increasing m
10.3. Multi-Measurement Faults: Increasing h
10.4. How Does Become Infinite for ?
11. Conclusions
Supplementary Materials
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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i | |||
---|---|---|---|
1 | |||
2 | |||
3 | |||
4 | |||
5 | |||
6 |
h | Faulty Measurements | |||
---|---|---|---|---|
0 | 0 | |||
3 * | 0 | ∞ | ||
4 * | 0 | ∞ | ||
5 * | 0 | ∞ | ||
6 * | 0 | ∞ |
m | ||||||
---|---|---|---|---|---|---|
6 | 29.78 | 1813.29 | ∞ | ∞ | ∞ | ∞ |
7 | 1.85 | 54.32 | 22,545.14 | ∞ | ∞ | ∞ |
8 | 1.22 | 3.5 | 53.41 | 22,729.26 | ∞ | ∞ |
9 | 0.94 | 3.14 | 24.59 | 63.98 | 4.86 × 10 | ∞ |
10 | 0.73 | 2.95 | 10.34 | 48.22 | 803.44 | 4.69 × 10 |
11 | 0.64 | 2.83 | 7.59 | 21.47 | 51.57 | 9597.89 |
12 | 0.43 | 1.06 | 2.94 | 10.11 | 21.46 | 594.47 |
13 | 0.43 | 1 | 1.89 | 7.63 | 12.29 | 26.46 |
14 | 0.43 | 1 | 1.9 | 7.32 | 11.17 | 23.49 |
15 | 0.45 | 0.91 | 1.69 | 5.8 | 9.82 | 22.46 |
16 | 0.33 | 0.63 | 1.24 | 3.71 | 5.89 | 11.52 |
17 | 0.33 | 0.59 | 1.21 | 3.21 | 5.31 | 11.12 |
18 | 0.11 | 0.42 | 0.68 | 1.31 | 3.32 | 5.4 |
19 | 0.11 | 0.22 | 0.52 | 0.78 | 1.42 | 3.43 |
20 | 0.1 | 0.21 | 0.49 | 0.75 | 1.27 | 3.02 |
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Uwineza, J.-B.; Farrell, J.A. RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults. Sensors 2023, 23, 4947. https://doi.org/10.3390/s23104947
Uwineza J-B, Farrell JA. RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults. Sensors. 2023; 23(10):4947. https://doi.org/10.3390/s23104947
Chicago/Turabian StyleUwineza, Jean-Bernard, and Jay A. Farrell. 2023. "RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults" Sensors 23, no. 10: 4947. https://doi.org/10.3390/s23104947
APA StyleUwineza, J. -B., & Farrell, J. A. (2023). RAIM and Failure Mode Slope: Effects of Increased Number of Measurements and Number of Faults. Sensors, 23(10), 4947. https://doi.org/10.3390/s23104947