Jiang, C.-W.; Ni, I.-C.; Hsieh, Y.-L.; Tzeng, S.-D.; Wu, C.-S.; Kuo, W.
Anderson Insulators in Self-Assembled Gold Nanoparticles Thin Films: Single Electron Hopping between Charge Puddles Originated from Disorder. Materials 2017, 10, 645.
https://doi.org/10.3390/ma10060645
AMA Style
Jiang C-W, Ni I-C, Hsieh Y-L, Tzeng S-D, Wu C-S, Kuo W.
Anderson Insulators in Self-Assembled Gold Nanoparticles Thin Films: Single Electron Hopping between Charge Puddles Originated from Disorder. Materials. 2017; 10(6):645.
https://doi.org/10.3390/ma10060645
Chicago/Turabian Style
Jiang, Cheng-Wei, I-Chih Ni, Yun-Lien Hsieh, Shien-Der Tzeng, Cen-Shawn Wu, and Watson Kuo.
2017. "Anderson Insulators in Self-Assembled Gold Nanoparticles Thin Films: Single Electron Hopping between Charge Puddles Originated from Disorder" Materials 10, no. 6: 645.
https://doi.org/10.3390/ma10060645
APA Style
Jiang, C. -W., Ni, I. -C., Hsieh, Y. -L., Tzeng, S. -D., Wu, C. -S., & Kuo, W.
(2017). Anderson Insulators in Self-Assembled Gold Nanoparticles Thin Films: Single Electron Hopping between Charge Puddles Originated from Disorder. Materials, 10(6), 645.
https://doi.org/10.3390/ma10060645