Yin, Y.; Ren, F.; Wang, Y.; Liu, Z.; Ao, J.; Liang, M.; Wei, T.; Yuan, G.; Ou, H.; Yan, J.;
et al. Direct van der Waals Epitaxy of Crack-Free AlN Thin Film on Epitaxial WS2. Materials 2018, 11, 2464.
https://doi.org/10.3390/ma11122464
AMA Style
Yin Y, Ren F, Wang Y, Liu Z, Ao J, Liang M, Wei T, Yuan G, Ou H, Yan J,
et al. Direct van der Waals Epitaxy of Crack-Free AlN Thin Film on Epitaxial WS2. Materials. 2018; 11(12):2464.
https://doi.org/10.3390/ma11122464
Chicago/Turabian Style
Yin, Yue, Fang Ren, Yunyu Wang, Zhiqiang Liu, Jinping Ao, Meng Liang, Tongbo Wei, Guodong Yuan, Haiyan Ou, Jianchang Yan,
and et al. 2018. "Direct van der Waals Epitaxy of Crack-Free AlN Thin Film on Epitaxial WS2" Materials 11, no. 12: 2464.
https://doi.org/10.3390/ma11122464
APA Style
Yin, Y., Ren, F., Wang, Y., Liu, Z., Ao, J., Liang, M., Wei, T., Yuan, G., Ou, H., Yan, J., Yi, X., Wang, J., & Li, J.
(2018). Direct van der Waals Epitaxy of Crack-Free AlN Thin Film on Epitaxial WS2. Materials, 11(12), 2464.
https://doi.org/10.3390/ma11122464