Wachulak, P.; Duda, M.; Fok, T.; Bartnik, A.; Wang, Z.; Huang, Q.; Sarzyński, A.; Jancarek, A.; Fiedorowicz, H.
Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source. Materials 2018, 11, 1303.
https://doi.org/10.3390/ma11081303
AMA Style
Wachulak P, Duda M, Fok T, Bartnik A, Wang Z, Huang Q, Sarzyński A, Jancarek A, Fiedorowicz H.
Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source. Materials. 2018; 11(8):1303.
https://doi.org/10.3390/ma11081303
Chicago/Turabian Style
Wachulak, Przemysław, Martin Duda, Tomasz Fok, Andrzej Bartnik, Zhanshan Wang, Qiushi Huang, Antoni Sarzyński, Alexandr Jancarek, and Henryk Fiedorowicz.
2018. "Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source" Materials 11, no. 8: 1303.
https://doi.org/10.3390/ma11081303
APA Style
Wachulak, P., Duda, M., Fok, T., Bartnik, A., Wang, Z., Huang, Q., Sarzyński, A., Jancarek, A., & Fiedorowicz, H.
(2018). Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source. Materials, 11(8), 1303.
https://doi.org/10.3390/ma11081303