Garcia-Baños, B.; Catalá-Civera, J.M.; Peñaranda-Foix, F.L.; Plaza-González, P.; Llorens-Vallés, G.
In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials 2016, 9, 349.
https://doi.org/10.3390/ma9050349
AMA Style
Garcia-Baños B, Catalá-Civera JM, Peñaranda-Foix FL, Plaza-González P, Llorens-Vallés G.
In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials. 2016; 9(5):349.
https://doi.org/10.3390/ma9050349
Chicago/Turabian Style
Garcia-Baños, Beatriz, Jose M. Catalá-Civera, Felipe L. Peñaranda-Foix, Pedro Plaza-González, and Gabriel Llorens-Vallés.
2016. "In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement" Materials 9, no. 5: 349.
https://doi.org/10.3390/ma9050349
APA Style
Garcia-Baños, B., Catalá-Civera, J. M., Peñaranda-Foix, F. L., Plaza-González, P., & Llorens-Vallés, G.
(2016). In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement. Materials, 9(5), 349.
https://doi.org/10.3390/ma9050349