Makarov, A.; Roussel, P.; Bury, E.; Vandemaele, M.; Spessot, A.; Linten, D.; Kaczer, B.; Tyaginov, S.
Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach. Micromachines 2020, 11, 657.
https://doi.org/10.3390/mi11070657
AMA Style
Makarov A, Roussel P, Bury E, Vandemaele M, Spessot A, Linten D, Kaczer B, Tyaginov S.
Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach. Micromachines. 2020; 11(7):657.
https://doi.org/10.3390/mi11070657
Chicago/Turabian Style
Makarov, Alexander, Philippe Roussel, Erik Bury, Michiel Vandemaele, Alessio Spessot, Dimitri Linten, Ben Kaczer, and Stanislav Tyaginov.
2020. "Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach" Micromachines 11, no. 7: 657.
https://doi.org/10.3390/mi11070657
APA Style
Makarov, A., Roussel, P., Bury, E., Vandemaele, M., Spessot, A., Linten, D., Kaczer, B., & Tyaginov, S.
(2020). Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach. Micromachines, 11(7), 657.
https://doi.org/10.3390/mi11070657