Article Versions Notes

Qiao Y, Zhao Y, Zhang Z, Liu B, Li F, Tong H, Wu J, Zhou Z, Xu Z, Zhang Y. Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB. Micromachines. 2022; 13(1):35. https://doi.org/10.3390/mi13010035

Qiao, Yi, Yalong Zhao, Zheng Zhang, Binbin Liu, Fusheng Li, Huan Tong, Jintong Wu, Zhanqi Zhou, Zongwei Xu, and Yue Zhang. 2022. "Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB" Micromachines 13, no. 1: 35. https://doi.org/10.3390/mi13010035

Qiao, Y., Zhao, Y., Zhang, Z., Liu, B., Li, F., Tong, H., Wu, J., Zhou, Z., Xu, Z., & Zhang, Y. (2022). Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB. Micromachines, 13(1), 35. https://doi.org/10.3390/mi13010035