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Journal: Micromachines, 2022
Volume: 13
Number: 1641

Article: Investigation of the Temperature Effect on Electrical Characteristics of Al/SiO2/n++-Si RRAM Devices
Authors: by Piotr Wiśniewski, Mateusz Nieborek, Andrzej Mazurak and Jakub Jasiński
Link: https://www.mdpi.com/2072-666X/13/10/1641

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