Xi, Y.; Qin, X.; Li, W.; Luo, X.; Zhang, J.; Liu, W.; Yang, P.
Effect of Substrate Negative Bias on the Microstructural, Optical, Mechanical, and Laser Damage Resistance Properties of HfO2 Thin Films Grown by DC Reactive Magnetron Sputtering. Micromachines 2023, 14, 1800.
https://doi.org/10.3390/mi14091800
AMA Style
Xi Y, Qin X, Li W, Luo X, Zhang J, Liu W, Yang P.
Effect of Substrate Negative Bias on the Microstructural, Optical, Mechanical, and Laser Damage Resistance Properties of HfO2 Thin Films Grown by DC Reactive Magnetron Sputtering. Micromachines. 2023; 14(9):1800.
https://doi.org/10.3390/mi14091800
Chicago/Turabian Style
Xi, Yingxue, Xinghui Qin, Wantong Li, Xi Luo, Jin Zhang, Weiguo Liu, and Pengfei Yang.
2023. "Effect of Substrate Negative Bias on the Microstructural, Optical, Mechanical, and Laser Damage Resistance Properties of HfO2 Thin Films Grown by DC Reactive Magnetron Sputtering" Micromachines 14, no. 9: 1800.
https://doi.org/10.3390/mi14091800
APA Style
Xi, Y., Qin, X., Li, W., Luo, X., Zhang, J., Liu, W., & Yang, P.
(2023). Effect of Substrate Negative Bias on the Microstructural, Optical, Mechanical, and Laser Damage Resistance Properties of HfO2 Thin Films Grown by DC Reactive Magnetron Sputtering. Micromachines, 14(9), 1800.
https://doi.org/10.3390/mi14091800