Sun, Z.; Chen, S.; Zhang, L.; Huang, R.; Wang, R.
The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms. Micromachines 2024, 15, 127.
https://doi.org/10.3390/mi15010127
AMA Style
Sun Z, Chen S, Zhang L, Huang R, Wang R.
The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms. Micromachines. 2024; 15(1):127.
https://doi.org/10.3390/mi15010127
Chicago/Turabian Style
Sun, Zixuan, Sihao Chen, Lining Zhang, Ru Huang, and Runsheng Wang.
2024. "The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms" Micromachines 15, no. 1: 127.
https://doi.org/10.3390/mi15010127
APA Style
Sun, Z., Chen, S., Zhang, L., Huang, R., & Wang, R.
(2024). The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms. Micromachines, 15(1), 127.
https://doi.org/10.3390/mi15010127