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Journal: Micromachines, 2024
Volume: 15
Number: 127

Article: The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms
Authors: by Zixuan Sun, Sihao Chen, Lining Zhang, Ru Huang and Runsheng Wang
Link: https://www.mdpi.com/2072-666X/15/1/127

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