Yan, Z.; Liu, H.; Huang, M.; Wang, S.; Chen, S.; Zhou, X.; Huang, J.; Liu, C.
Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs. Micromachines 2024, 15, 1292.
https://doi.org/10.3390/mi15111292
AMA Style
Yan Z, Liu H, Huang M, Wang S, Chen S, Zhou X, Huang J, Liu C.
Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs. Micromachines. 2024; 15(11):1292.
https://doi.org/10.3390/mi15111292
Chicago/Turabian Style
Yan, Zhanpeng, Hongxia Liu, Menghao Huang, Shulong Wang, Shupeng Chen, Xilong Zhou, Junjie Huang, and Chang Liu.
2024. "Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs" Micromachines 15, no. 11: 1292.
https://doi.org/10.3390/mi15111292
APA Style
Yan, Z., Liu, H., Huang, M., Wang, S., Chen, S., Zhou, X., Huang, J., & Liu, C.
(2024). Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs. Micromachines, 15(11), 1292.
https://doi.org/10.3390/mi15111292
