Zhao, X.; Su, Y.; Chen, Y.; Zhang, Y.; Xiang, J.; Cheng, S.; Bai, Y.
The Study on Single-Event Effects and Hardening Analysis of Frequency Divider Circuits Based on InP HBT Process. Micromachines 2024, 15, 527.
https://doi.org/10.3390/mi15040527
AMA Style
Zhao X, Su Y, Chen Y, Zhang Y, Xiang J, Cheng S, Bai Y.
The Study on Single-Event Effects and Hardening Analysis of Frequency Divider Circuits Based on InP HBT Process. Micromachines. 2024; 15(4):527.
https://doi.org/10.3390/mi15040527
Chicago/Turabian Style
Zhao, Xiaohong, Yongbo Su, You Chen, Yihao Zhang, Jianjun Xiang, Siyi Cheng, and Yurong Bai.
2024. "The Study on Single-Event Effects and Hardening Analysis of Frequency Divider Circuits Based on InP HBT Process" Micromachines 15, no. 4: 527.
https://doi.org/10.3390/mi15040527
APA Style
Zhao, X., Su, Y., Chen, Y., Zhang, Y., Xiang, J., Cheng, S., & Bai, Y.
(2024). The Study on Single-Event Effects and Hardening Analysis of Frequency Divider Circuits Based on InP HBT Process. Micromachines, 15(4), 527.
https://doi.org/10.3390/mi15040527
