Han, M.; Smith, D.; Kahro, T.; Stonytė, D.; Kasikov, A.; Gailevičius, D.; Tiwari, V.; Ignatius Xavier, A.P.; Gopinath, S.; Ng, S.H.;
et al. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines 2024, 15, 537.
https://doi.org/10.3390/mi15040537
AMA Style
Han M, Smith D, Kahro T, Stonytė D, Kasikov A, Gailevičius D, Tiwari V, Ignatius Xavier AP, Gopinath S, Ng SH,
et al. Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines. 2024; 15(4):537.
https://doi.org/10.3390/mi15040537
Chicago/Turabian Style
Han, Molong, Daniel Smith, Tauno Kahro, Dominyka Stonytė, Aarne Kasikov, Darius Gailevičius, Vipin Tiwari, Agnes Pristy Ignatius Xavier, Shivasubramanian Gopinath, Soon Hock Ng,
and et al. 2024. "Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride" Micromachines 15, no. 4: 537.
https://doi.org/10.3390/mi15040537
APA Style
Han, M., Smith, D., Kahro, T., Stonytė, D., Kasikov, A., Gailevičius, D., Tiwari, V., Ignatius Xavier, A. P., Gopinath, S., Ng, S. H., John Francis Rajeswary, A. S., Tamm, A., Kukli, K., Bambery, K., Vongsvivut, J., Juodkazis, S., & Anand, V.
(2024). Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines, 15(4), 537.
https://doi.org/10.3390/mi15040537