Mayr, S.; Finizio, S.; Reuteler, J.; Stutz, S.; Dubs, C.; Weigand, M.; Hrabec, A.; Raabe, J.; Wintz, S.
Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples. Crystals 2021, 11, 546.
https://doi.org/10.3390/cryst11050546
AMA Style
Mayr S, Finizio S, Reuteler J, Stutz S, Dubs C, Weigand M, Hrabec A, Raabe J, Wintz S.
Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples. Crystals. 2021; 11(5):546.
https://doi.org/10.3390/cryst11050546
Chicago/Turabian Style
Mayr, Sina, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe, and Sebastian Wintz.
2021. "Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples" Crystals 11, no. 5: 546.
https://doi.org/10.3390/cryst11050546
APA Style
Mayr, S., Finizio, S., Reuteler, J., Stutz, S., Dubs, C., Weigand, M., Hrabec, A., Raabe, J., & Wintz, S.
(2021). Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples. Crystals, 11(5), 546.
https://doi.org/10.3390/cryst11050546