Chang, Y.; Xiao, A.; Li, R.; Wang, M.; He, S.; Sun, M.; Wang, L.; Qu, C.; Qiu, W.
Angle-Resolved Intensity of Polarized Micro-Raman Spectroscopy for 4H-SiC. Crystals 2021, 11, 626.
https://doi.org/10.3390/cryst11060626
AMA Style
Chang Y, Xiao A, Li R, Wang M, He S, Sun M, Wang L, Qu C, Qiu W.
Angle-Resolved Intensity of Polarized Micro-Raman Spectroscopy for 4H-SiC. Crystals. 2021; 11(6):626.
https://doi.org/10.3390/cryst11060626
Chicago/Turabian Style
Chang, Ying, Aixia Xiao, Rubing Li, Miaojing Wang, Saisai He, Mingyuan Sun, Lizhong Wang, Chuanyong Qu, and Wei Qiu.
2021. "Angle-Resolved Intensity of Polarized Micro-Raman Spectroscopy for 4H-SiC" Crystals 11, no. 6: 626.
https://doi.org/10.3390/cryst11060626
APA Style
Chang, Y., Xiao, A., Li, R., Wang, M., He, S., Sun, M., Wang, L., Qu, C., & Qiu, W.
(2021). Angle-Resolved Intensity of Polarized Micro-Raman Spectroscopy for 4H-SiC. Crystals, 11(6), 626.
https://doi.org/10.3390/cryst11060626