Interplay between Habit Plane and Orientation Relationship in an Electron Backscatter Diffraction Analysis: Using the Example of η′-Al8Fe3 in η-Al5Fe2
Abstract
:1. Introduction
2. Methods
2.1. Preparation and Heat Treatment of the Al-Fe Intermetallic Alloy
2.2. Acquisition of EBSD Patterns
2.3. Indexing of EBSD Patterns
2.4. Data Analysis
3. Theory
3.1. Crystallographic Characteristics of η′ Variants in η
3.2. Habit Planes
4. Results
4.1. General Appearance of the Microstructure
4.2. Basic Evaluation of EBSD Data
4.2.1. Phase Distinction and Orientation Determination
4.2.2. Orientation Distribution, Orientation Relationships and Misorientations
4.3. Habit Plane Determination
4.3.1. Determination of Traces
4.3.2. Pure Evaluation of Traces
4.3.3. Combined Evaluation of Misorientations and Traces
5. Discussion
5.1. Implications for the Al5Fe2 Intermetallic
5.2. Utilization the Combined Evaluation of Misorientations and Traces for Habit Plane Analysis
- (a)
- Orientations of real-space features suffer from all types of image distortions [53]. The systematic distortion effects cancel out upon determination of misorientations of, e.g., adjacent crystallites, whereas the measurable orientation of real-space features like traces of habit planes are fully affected by these distortions. See Appendix C for an assessment of these errors for the present data.
- (b)
- As it concerns habit planes (and other planar features), the usual two-dimensional sections do not directly reveal the complete plane orientation, because the inclination angle of the habit plane with respect to the specimen surface is not directly available. Solutions to this problem can be as follows:
- (i)
- The classical two-trace analysis applied on one and the same feature [54], applied to a specimen having a suitable geometry or which has been brought into suitable geometry [55,56,57]. Habit plane determination in the course of the combination of EBSD with three-dimensional sectioning has to be regarded as a special case of this two-section method, where the corresponding information becomes available automatically [58,59,60].
- (ii)
- Use of two-dimensional data in connection with guessed (likely low-index) or predicted (by some appropriate theory, like the phenomenological theory of martensite crystallography) habit planes, allowing for calculation of trace orientations which can be compared with the experimental trace orientation. A sufficient number of observed traces must agree within the experiment so as to regard the guess or prediction as confirmed. This method is definitely a routine and very common method with much more numerous examples being around than cited for (i).
- (iii)
- Plot experimentally determined trace orientations in the crystal coordinates of one of the two crystals separated by the habit plane (possibly affected by the above-mentioned errors) into a stereographic projection, which then should follow a set of symmetry-equivalent big circles of the habit plane. As with method (ii), this procedure is only applicable if a low numbered set of habit planes dominates in the specimen. Consequently, this method is not suitable for specimens with more or less varying habit planes, such as more or less random grain boundaries in single-phase polycrystals. Note that the stereological method known as the five-parameter analysis used to determine full boundary plane distributions is applicable for sufficiently large 2D EBSD maps of reasonably high indexing quality [61,62] and encompasses all interfaces, not only a limited number of specific ones.Method (iii) has succeeded in the present work, as shown in Section 4.3.2 and leading to Figure 7. This success was made possible by the low orthorhombic and monoclinic symmetries of the η and η′ phases investigated in the present study, with four or two habit planes equivalent by symmetry. In case of higher symmetry, like cubic mm (or rotation group 432), one expects the traces to be distributed on 24 big circles of the 24 symmetry-equivalent habit planes. These may be distributed so densely over the stereographic projection that the scatter does not allow clear identification of the big circles. The situation is more favorable if the habit planes assume high-symmetry orientations, allowing, e.g., identification of {110} habit planes of crystallites of a cubic phase using this method [63].
- (iv)
- The method applied in Section 4.3.3 and leading to Figure 8 (which might be conceived as a method (iv)), using simultaneously crystal orientation and trace information, is generally applicable, if a single orientation relationship predominantly occurs between identifiable pairs of crystals (of the same or different phases) in connection with a dominant habit plane. A dominant habit plane then implies that the plane orientation (here and for two distinct parent and child phases) is fixed in both crystals. In that case the information of the traces can be combined with that on the orientation relationship between the two crystal, thus overcoming the necessity to consider up to 24 big circles in the case of high crystal symmetry. Hence, this method can serve as a new tool allowing for determination of re-occurring habit planes based on two-dimensional EBSD data.
6. Summary and Conclusions
- I
- The trace directions in crystal coordinates of η and η′ assemble around a set of four (η), respectively two (η′), big circles corresponding to a set of symmetry invariant habit plane poles.
- II
- Requiring that for a given orientation of η′ with respect to η, having no symmetry elements of the two crystals in common, there should be a fixed η′ habit plane parallel to a fixed η habit plane.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
Appendix A. Structure Models
Phase | Subcell | Space Group | Site | Wyckoff Label | Atomic Position | Occupation | ||
---|---|---|---|---|---|---|---|---|
x | y | z | ||||||
H‴ (η) | Orthorhombic | Cmcm | Al(1) | 8g | 0.188 | 0.1467 | 0.25 | 0.32 |
Al(2) | 4b | 0 | 0.5 | 0 | 0.24 | |||
Al(3) | 8f | 0.24 | 0 | 0.534 | 1 | |||
Fe(1) | 4c | 0 | 0.8277 | 0.25 | 1 | |||
H′ | Monoclinic/Pseudo-orthorhombic | C2/c | Al(1) | 8f | 0.188 | 0.1467 | 0.25 | 0.32 |
Al(2) | 4b | 0 | 0.5 | 0 | 0.24 | |||
Al(3) | 8f | 0.24 | 0 | 0.534 | 1 | |||
Fe(1) | 4e | 0 | 0.8277 | 0.25 | 1 |
Appendix B. Transformation Strain
- The isotropic volume change due to the strain will lead to a change of the widths of all Kikuchi bands, which will be hardly visible.
- The deviatoric part of the strain will lead to change in the widths of certain bands and, more importantly for standard EBSD analysis, to a change in the intraband angles.
Appendix C. Accuracy of Trace Determination
- (1)
- A high sample tilt angle such as the 70° most often applied during EBSD measurements is responsible for geometrically-caused image distortions [53]. Even small deviations of sample surface from parallelism of the plane of the tilted stage cause large rhomboidal distortions which are approx. 3 times larger errors in the projected image than the deviation in the sample set-up [53]. A trapezium distortion must be considered when low magnifications are employed and can be neglected in the present case of applied high magnifications [53]. Using the example of the particle in Figure 2b, the relevance of image distortion is emphasized in Figure A2a. The trace orientation differs by 6° if measured for the tilted instead of for the untilted state. Therefore, the latter is used for determination of trace orientation via angle α to describe the traces in the sample coordinate system. Additionally, effects of beam or image drift can lead to image distortions (which a very sample- and system-dependent), especially for long acquisition times such as during the EBSD measurements which was only 1.3° of the trace in the EBSD map to the image in the tilted state (Figure A2). Thus, the error can be reduced using images with moderate acquisition times for the measurement of the trace orientation. Consequently, it is highly recommended that the trace orientation should be measured on an untilted BSE or SE image to avoid errors from image distortions.Image distortions also influence relative and absolute crystallographic orientation data. Nevertheless, the relative accuracy between orientations is mainly affected at low magnifications and is largely avoidable using an appropriate projection center calibration from the mapping center to edge [53]. However, for absolute orientations, a misalignment of the sample and stage coordinate systems leads to misinterpretations of the orientation information and is, therefore, reflected in the accuracy of the measured traces. Although it might be recommended to correct the orientations for the misalignment, correct alignment information is hardly accessible. Therefore, present orientation data were not corrected. However, in this study, the sample had been mounted and remounted several times between the measurements of the particles, so that errors from image distortion should be averaged.
- (2)
- Often habit planes are not detectable as perfectly planar planes in a microstructure. These planes can have curvatures or modulations. Moreover, in the present case of η′ variants within the η matrix, the variants have not straight planar edges but appear with needle- or lens-like shaped variants. However, not all variants are symmetric or similarly curved as neighboring variants. Therefore, a mean central line of the neighboring variants is used to determine the trace orientation (Figure A2b).
- (3)
- Next to image distortion, different adjustments of indexing parameters also lead to slightly different orientation solutions. Moreover, offsets of the projection center calibration at high magnifications lead to slightly different orientation solutions when comparing the different maps. The misorientation angle is between 0.5° and 1° for the same pixels in different maps in Figure 4, indexed with PCX = 0.547 but PCY = 0.76 or PCY = 0.77. Similarly, e.g., the Hough-space resolution, the choice of band centers and band edges, and number of bands, lead to slightly different orientation solutions.
Appendix D. Effect of Minimization Functional
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Label | Formula | Order | Space Group | Approx. Number of Atoms Per Channel | Channel Atom Species | Reference |
---|---|---|---|---|---|---|
η | Al5Fe2 | Disordered | Cmcm | 1.47–1.5 | Al and Fe | [24,31] |
η″ | Incommensurate a | Xmcm(00g)0s0 Immm(00g)0s0 | 1.42–1.43 | Al and Fe | [30] | |
Al7-xFe3 | Commensurate | Pmcnb | Al and Fe | [31] | ||
ηm | - | - | - | - | [28] | |
η′ | Al8Fe3 | Commensurate | C2/c | 1.33 | Al | [24,29] |
η‴ | Incommensurate a | P21/c(0b0)00 P21/c(0b0)s0 | 1.46–1.48 | Al (Fe) | [30] |
Phase | Subcell | Space Group | Lattice Parameters | Reference | |||
---|---|---|---|---|---|---|---|
[Å] | [Å] | [Å] | [°] | ||||
η‴ (η) | Orthorhombic | Cmcm | [30] | ||||
7.6596 | 6.4070 | 4.2344 | 90 | ||||
η′ | Monoclinic/Pseudo-orthorhombic | C2/ca | [24] b | ||||
7.6661 | 6.4244 | 4.1625 | 90.494 |
Method | |||
---|---|---|---|
Pure evaluation of traces | |||
| {1 1.6 2.2}η, | {1 4.4 5.8}η′, | 7° |
| – | {1 1.8 2.5}η′, | 1° |
Combined evaluation of misorientations and traces | |||
| {1 1.8 2.5}η, | {1 1.8 2.5}η′, | 0° |
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Becker, H.; Hielscher, R.; Leineweber, A. Interplay between Habit Plane and Orientation Relationship in an Electron Backscatter Diffraction Analysis: Using the Example of η′-Al8Fe3 in η-Al5Fe2. Crystals 2022, 12, 813. https://doi.org/10.3390/cryst12060813
Becker H, Hielscher R, Leineweber A. Interplay between Habit Plane and Orientation Relationship in an Electron Backscatter Diffraction Analysis: Using the Example of η′-Al8Fe3 in η-Al5Fe2. Crystals. 2022; 12(6):813. https://doi.org/10.3390/cryst12060813
Chicago/Turabian StyleBecker, Hanka, Ralf Hielscher, and Andreas Leineweber. 2022. "Interplay between Habit Plane and Orientation Relationship in an Electron Backscatter Diffraction Analysis: Using the Example of η′-Al8Fe3 in η-Al5Fe2" Crystals 12, no. 6: 813. https://doi.org/10.3390/cryst12060813
APA StyleBecker, H., Hielscher, R., & Leineweber, A. (2022). Interplay between Habit Plane and Orientation Relationship in an Electron Backscatter Diffraction Analysis: Using the Example of η′-Al8Fe3 in η-Al5Fe2. Crystals, 12(6), 813. https://doi.org/10.3390/cryst12060813